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A high-precision measurement method for IC card chip scratch area and gray scale parameters

A measurement method and high-precision technology, which can be used in spectrometry/spectrophotometry/monochromator, measuring device, color measuring device, etc., and can solve the problem that the judgment result is not supported by scientific data.

Active Publication Date: 2018-05-18
STATE GRID CORP OF CHINA +1
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, for a long time, the chip wear detection of the smart meter electricity purchase card is judged by the human eye, and the judgment result is not supported by scientific data.

Method used

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  • A high-precision measurement method for IC card chip scratch area and gray scale parameters
  • A high-precision measurement method for IC card chip scratch area and gray scale parameters
  • A high-precision measurement method for IC card chip scratch area and gray scale parameters

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Embodiment Construction

[0024] The structural features of the present invention will now be described in detail in conjunction with the accompanying drawings.

[0025] see figure 1 , a kind of IC card chip scratch area and the high precision measuring method of gray scale parameter, carry out as follows:

[0026] Step 1: Prepare two power purchase card chips, one of which is used as a standard sample card, and the other is used as a chip for testing. Clean the standard sample card and the detection chip.

[0027] Step 2: Put the detection chip into the card slot of the smart meter for N consecutive insertions and removals, where the value of N ranges from 10 to 10,000. The standard sample card and the detection chip after N times of insertion and removal are respectively optically imaged by the CCD.

[0028] Step 3: Capture the optical imaging result of the standard sample card by the CCD and save it as a standard base image. The CCD captures images of the optical imaging results of the detection...

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Abstract

The present invention proposes a high-precision measurement method for IC card chip scratch area and grayscale parameters, including 7 steps; Clean and scratch-free power purchase card, insert it into the card slot for plug-and-pull test, scan the power purchase card to be tested through CCD, compare it with the base map, analyze the difference is the scratch information, use a certain algorithm to analyze the scratch information Analysis to achieve the purpose of quantitative detection of scratches. Beneficial technical effects: the present invention can overcome the problems of inconsistent human observation and evaluation standards, large manual errors, etc., based on digital image processing, using the BLOB algorithm to calculate the scratch area and gray parameters, accurate, fast and quantitative Analysis of scratches on power purchase cards.

Description

technical field [0001] The invention belongs to the technical field of device image detection, and in particular relates to a high-precision measurement method for IC card chip scratch area and gray scale parameters. Background technique [0002] With the widespread promotion of smart meters, the local fee control model has played an important role in electricity price recovery. Each local fee control meter is equipped with a power purchase card held by residents as a payment and recharge medium. The meter has a built-in card slot. Data exchange is performed after the electric card is inserted into the card slot. Since there are many card slot spring manufacturers, the material, spring pressure and other factors are all different, so the card slot spring may cause scratches and wear on the chip inserted into the power purchase card. Deep scratches and wear will lead to damage to the power purchase card chip. If there is permanent damage, users will not be able to purchase e...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/28G01J3/46G01J3/50G01N19/04G06K9/46
CPCG01B11/28G01J3/462G01J3/50G01N19/04G06V10/56
Inventor 付真斌陈自年曾世杰陈晨蔺菲梁晓伟胡吕龙黄丹
Owner STATE GRID CORP OF CHINA
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