Test system, method and device

A test system and tested technology, applied in the computer field, can solve problems such as inability to solve USB device testing and small improvement in test efficiency.

Active Publication Date: 2016-04-20
BEIJING QIHOO TECH CO LTD +1
View PDF5 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this semi-automated test solution still cannot solve the problem of testing a large number of USB devices, and the test efficiency is small.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test system, method and device
  • Test system, method and device
  • Test system, method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0096] Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0097] In order to solve the above technical problems, an embodiment of the present invention provides a test system, figure 1 A schematic structural diagram of a test system according to an embodiment of the present invention is shown. like figure 1 As shown, the system at least includes: a central controller 110, at least one physical machine 120, and a plurality of devices under test 140 physically connected to the connector in...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a test system, method and device; the test system comprises a central controller, at least one physical machine, and a plurality of tested devices physically connected with connectors of the physical machine; each physical machine is provided with at least one virtual machine capable of testing the tested device; the control controller receives a test task, and sends a test order to the physical machine having one or more virtual machines; the physical machine receives the test order, starts the corresponding virtual machines, and the started virtual machines can identify the tested device, thus executing the test task. The physical machine and virtual machine can realize interaction work, and the virtual machine can identify the tested device so as to realize automatic testing of the tested device in the virtual machine; manual plugging is not needed, so manpower resource is librated, thus largely improving test efficiency.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a test system, method and device. Background technique [0002] USB (Universal Serial Bus, Universal Serial Bus) is a serial bus standard that connects computer systems and external devices, and is also a technical specification for input and output interfaces. Equipment, digital TV (set-top box), game console and other related fields. At present, common USB devices include U disk (full name USB flash drive), camera, keyboard, mouse, printer, scanner, etc. Many software functions involve interaction with USB devices, so in the testing process of such software, testers need to insert USB devices into the physical machine for testing. [0003] In related technologies, USB device testing mainly relies on testers to manually test on a physical machine. In order to simulate the initial connection and disconnection of the USB device to the system, the test process requires frequen...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/455G06F11/36
Inventor 李珂张杰
Owner BEIJING QIHOO TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap