IGBT device and manufacturing method for improving field strength uniformity of active region and terminal connection region
A technology of terminal connection and active area, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of slow IGBT switching speed, reduce IGBT reliability, reduce transmission speed, etc., and reduce switching speed. Losses, Enhanced Reliability, Increased Switching Speed Effects
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[0040] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0041] The technical terms are explained in detail below:
[0042] Aluminum lead area: a window opened on the passivation layer of the chip, on which a metal wire is welded during packaging, and connected to the pin to lead out the potential. Specifically, there are gate aluminum lead area and emitter aluminum lead area.
[0043] Gate aluminum lead area: In order to ensure that the edge cells are turned on or off at the same time, the edge cells are usually surrounded by metal rings, and then the gate potential is transmitted through polysilicon.
[0044] Active area: The area where the silicon wafer is used as an active device. For IGBT devices, it mainly refers to the cell area.
[0045] Terminal P-type field limiting ring: a region formed by doping with P-type impurities.
[0046] The invention provides an IGBT de...
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