Unlock instant, AI-driven research and patent intelligence for your innovation.

Coordinate graphic display unit and display method of testing system

A coordinate graphics and testing system technology, applied in the direction of electronic circuit testing, etc., can solve the problems of integrated circuit testing in real time and low debugging efficiency, and achieve the effect of convenient and fast testing methods

Active Publication Date: 2019-01-11
HANGZHOU CHANGCHUAN TECH CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to overcome the shortcomings of the prior art that the integrated circuit cannot be tested in real time and the debugging efficiency is low, and provide a system for integrated chip testing and its scanning test and display method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Coordinate graphic display unit and display method of testing system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0026] A coordinate graphic display unit of a test system (see attached figure 1 ), applicable to a waveform test system, including a communication interface module, a probe coordinate acquisition module and a Map display module, the communication interface module is connected with the waveform test system, the probe coordinate acquisition module is connected with the communication interface module, and the Map The display module is connected with the probe coordinate acquisition module, and the Map display module includes a graphic display module, a Bin value quantity display module, a color setting module, a parameter setting module and a file preservation module, a graphic display module, a Bin value quantity display module, The color setting module, the parameter setting module and the file saving module are all connected with the probe coordinate acquisition module, the waveform test system includes a circuit parameter acquisition module and a circuit parameter display mod...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a coordinate figure display unit of a test system, and solves the problems in the prior art. The display unit comprises a communication interface module, a probe coordinate obtaining module and a Map display module, the communication interface module is connected with a waveform test system, the probe coordinate obtaining module is connected with the communication interface module, and the Map display module is connected with the probe coordinate obtaining module, and further comprises a figure display module, a Bin value display module, a color setting module, a parameter setting module and a file play module.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a system for testing integrated chips and its scanning testing and display methods. Background technique [0002] Integrated circuit testing is an important part of integrated circuit production. Test accuracy and test efficiency directly affect product quality and cost; product test parameter debugging before mass production testing is time-consuming and labor-intensive, and an oscilloscope is an essential tool during debugging. The relevant values ​​of the test parameters need to be adjusted according to the readings of the oscilloscope. [0003] When the engineer debugs the test circuit and test program of the integrated circuit tester, he hopes to have a simpler tool than the oscilloscope, which can observe the real-time results of the parameters and improve the debugging efficiency. [0004] On May 23, 2012, the State Intellectual Property Office of the People's Re...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 吴友凤蒋浩华钟锋浩
Owner HANGZHOU CHANGCHUAN TECH CO LTD