Probe card

A probe card and probe technology, applied in the field of probe cards, can solve the problems of increased design cost, circuit layout restrictions, and increased difficulty of probe card circuit layout, etc.

Active Publication Date: 2016-06-08
MICROELECTRONICS TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, limited by the space of the printed circuit board on the probe card, these electronic circuits often cannot be fully installed, or increase the difficulty of the circuit layout of the probe card, resulting i

Method used

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Examples

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Embodiment Construction

[0040] A number of embodiments of the present invention will be disclosed below with the accompanying drawings. For the sake of clarity, many practical details will be described together in the following description. It should be understood, however, that these practical details should not be used to limit the invention. That is, in some embodiments of the present invention, these practical details are unnecessary. In addition, for the sake of simplifying the drawings, some known and conventional structures and elements will be shown in a simple and schematic manner in the drawings.

[0041] Unless otherwise defined, all terms (including technical and scientific terms) used herein have their ordinary meanings that can be understood by those skilled in the art. Furthermore, the definitions of the above-mentioned words in the commonly used dictionaries should be interpreted in the content of this specification as meanings consistent with the relevant fields of the present inven...

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PUM

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Abstract

The invention provides a probe card comprising a printed circuit board, a power supply/signal conductor sheet, a grounding conductor sheet, an insulator, an electronic circuit, a power supply/signal probe and a grounding probe. The power supply/signal conductor sheet is electrically connected with a power supply or a signal. The grounding conductor sheet is electrically connected with a grounding potential. The insulator is arranged between the power supply/signal conductor sheet and the grounding conductor sheet. The electronic circuit is electrically connected with the power supply/signal conductor sheet and the grounding conductor sheet. The power supply/signal probe is electrically connected with the power supply/signal conductor sheet and the power supply/signal probe is directly or indirectly connected with the printed circuit board and is used for in point contact a grounding contact of an object to be measured. The grounding conductor sheet is arranged between the printed circuit board and the grounding probe. The probe card is capable of providing enough space, so that the electronic circuit can be fully installed without limited to the finite space on the printed circuit board.

Description

technical field [0001] The present invention relates to a probe card, and in particular to a cantilever type probe card. Background technique [0002] The main purpose of the probe card is to directly contact the pads or bumps on the object under test (such as a chip) through its probes, and cooperate with the peripheral test machine and software control to achieve the purpose of automatic measurement and further screen To produce defective products, the test signal is usually sent through the test machine, and then sent to the object under test through the probe card, and then the test result signal is sent back by the object under test, and then analyzed by the probe card to the test instrument. [0003] The probe card has a precise contact mechanism to test the circuit on the chip and perform electrical testing operations to ensure that the electrical characteristics and performance of the chip are manufactured according to the design specifications. When testing, it is ...

Claims

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Application Information

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IPC IPC(8): G01R1/073
Inventor 彭匀奎范纲炯
Owner MICROELECTRONICS TECH INC
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