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Test generation method

A technology for identifying data and dot matrix, applied in the field of test generation, can solve problems such as low efficiency and waste of time, and achieve the effect of improving work efficiency

Inactive Publication Date: 2016-06-15
BEIJING QILU MANAGEMENT CONSULTING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

In the traditional teaching method, the teacher distributes the test papers to the students after they write the questions, and when the students finish their answers, they hand in the test papers, and the teachers review and calculate the scores one by one. When there are a lot of test papers, a lot of time is wasted and the efficiency is low.

Method used

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Embodiment Construction

[0027] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.

[0028] The terminal equipment in the present invention includes mobile phones, tablet computers, notebook computers, desktop computers and other terminal equipment with processing capabilities.

[0029] figure 1 It is a schematic diagram of the quiz generation method provided by the embodiment of the present invention. Such as figure 1 As shown, the test generation method of the embodiment of the present invention includes:

[0030] Step 101, receiving a first file with dot matrix information.

[0031] Specifically, the terminal device receives an electronic version file of test questions with dot matrix information, and the file format may specifically be pdf, etc., and the first file has a first file ID.

[0032] Among them, the lattice is composed of several points, which are arranged according to special algori...

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Abstract

The invention relates to a test generation method. The test generation method includes the steps: receiving a first file with the lattice information; setting the test time, and receiving the discrete image data, sent from a lattice recognition device, of a discrete lattice area of the first file, within the range of the test time; analyzing the discrete image data to obtain each first discrete lattice data corresponding to each discrete image data; recognizing the each first discrete lattice data as one first discrete recognition data; and matching different first discrete recognition data with the corresponding first standard discrete recognition data. The test generation method utilizes the lattice recognition technology to realize high efficiency of automation to perform test scoring.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to a test generating method. Background technique [0002] With the improvement of the degree of social informatization, informatization has penetrated into all aspects of daily work and life. [0003] In the process of education and teaching, teachers often need to test students if they want to know how well students have mastered knowledge. In the traditional teaching method, the teacher distributes the test papers to the students after writing the questions, and when the students have finished answering, they hand in the test papers, and the teachers review and calculate the scores one by one. When there are a lot of test papers, a lot of time is wasted and the efficiency is low. Therefore, it is necessary to introduce informatization into traditional education, and to realize automated and efficient test scoring through computers. Contents of the invention [0004] T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09B7/02G06Q50/20
CPCG09B7/02G06Q50/20
Inventor 田雪松
Owner BEIJING QILU MANAGEMENT CONSULTING CO LTD
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