Unlock instant, AI-driven research and patent intelligence for your innovation.

Ring part structure and manufacturing method thereof

A manufacturing method and ring technology, applied in ion implantation plating, metal material coating process, coating, etc., can solve problems such as easy drop on the sputtering surface, product defects, production progress impact, etc., to achieve reduction The effect of reducing the probability of peeling phenomenon and the probability of discharge breakdown phenomenon

Active Publication Date:
View PDF5 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the existing ring structure may affect the quality of sputtering deposition during use. For example, particles generated by sputtering will remain on the ring structure during the sputtering process. These particles accumulate on the ring structure and become Deposits, peeling will occur after the deposits accumulate to a certain extent. The peeled deposits will not only affect the sputtering environment, but also easily fall on the sputtering surface, resulting in product defects or even scrapping
In addition, the exfoliated deposits may also cause abnormal discharge phenomena in the sputtering equipment during the sputtering deposition process, and the sputtering equipment will stop working unexpectedly, which will affect the entire production schedule

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ring part structure and manufacturing method thereof
  • Ring part structure and manufacturing method thereof
  • Ring part structure and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The reason for the peeling phenomenon in the prior art is that the surface area of ​​the annular body in the ring structure is small, and the ability to absorb the particles generated by sputtering is weak during the sputter deposition process, which in turn causes the particles to be deposited on the ring. When the structure gathers to a certain extent, exfoliation occurs, which may not only lead to a decrease in the yield of the product, but may also cause abnormal discharge in the sputtering equipment during the sputtering deposition process.

[0033] Therefore, the present invention provides a ring structure comprising:

[0034] The annular body part includes two annular end faces opposite to each other in the axial direction, and an outer circumferential surface and an inner circumferential surface arranged between the two annular end faces and radially opposite to each other, the outer circumferential surface and the inner circumferential surface The two annular e...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
radiusaaaaaaaaaa
radiusaaaaaaaaaa
Login to View More

Abstract

The invention provides a ring part structure and a manufacturing method thereof. The ring part structure comprises a ring body, an outer circumferential surface and two ring-shaped end faces of the ring body are connected through circular beads, an inner outer circumferential surface and the two ring-shaped end faces of the ring body are connected through circular beads, and the fillet radii of the circular beads are smaller than the width of the outer circumferential surface by a half. The manufacturing method of the ring part structure comprises the steps of forming the ring body; and carrying out chamfering treatment until the outer circumferential surface and the two ring-shaped end faces of the ring body are connected through the circular beads, the inner outer circumferential surface and the two ring-shaped end faces of the ring body are connected through the circular beads, and the fillet radii of the circular beads are smaller than the width of the outer circumferential surface by a half. The ring part structure and the manufacturing method have the beneficial effects that the superficial area of the ring body is relatively large, the ability of the ring body to adsorb particulate matter generated by sputtering is higher, and the probability of peeling is lowered; the superficial area of the ring body is larger, and therefore the probability of discharge breakdown is greatly lowered in the sputtering deposition process, and the influence of the ring part structure to the sputtering deposition process is reduced in the use process of the ring part structure.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a ring structure and a manufacturing method thereof. Background technique [0002] A sputtering process is commonly used in semiconductor manufacturing, and this process is used to sputter metal onto a substrate to form a thin film. This process is a kind of physical vapor deposition (Physical Vapor Deposition, PVD), which bombards the sputtering target with high-energy particles, so that the atoms or molecules of the bombarded target are deposited on the surface of the substrate to form a thin film. [0003] In the sputtering process, in order to improve the uniformity of sputtering deposition, a ring structure is usually arranged in the sputtering equipment to constrain the trajectory of the sputtered particles, that is to say, the ring structure plays a role in the sputtering process. to the role of focusing high-energy particles. [0004] For details, please refer...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/34
Inventor 姚力军潘杰相原俊夫大岩一彦王学泽滕俊