Metallographic specimen clamping device

A clamping device and metallographic sample technology, applied in the preparation of test samples, grinding workpiece supports, etc., can solve problems such as uneven edges, inconvenient clamping, and chamfering, and achieve low production costs and easy operation. Convenience, easy disassembly and assembly

Inactive Publication Date: 2016-06-22
DATANG DONGBEI ELECTRIC POWER TESTING & RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

While ensuring the observation area, the height of the sample should not be too high, and in order to ensure the conductivity of the material, the sample cannot be in

Method used

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  • Metallographic specimen clamping device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0018] Such as Figures 1 to 6 As shown, the metallographic sample clamping device of this embodiment includes: an upper clamp 1 and a lower clamp 2, and the clamping surfaces of the upper clamp and the lower clamp are provided with anti-slip protrusion structures. The corresponding positions on the upper and lower clamps are respectively provided with two through holes, and the two through holes on the upper and lower clamps are arranged symmetrically; the studs 3 pass through the upper and lower clamps. The through holes at the corresponding positions are provided with nuts 4 on the studs. The corresponding positions on the clamping surfaces of the upper clamp and the lower clamp are respectively provided with a V-shaped notch groove. The V-shaped notch grooves on the upper and lower clamps are arranged between the two through holes.

[0019] In this embodiment, the upper fixture 1 is a rectangular parallelepiped aluminum plate with two through holes, the through holes are...

Embodiment 2

[0023] Such as figure 2 As shown, the metallographic sample clamping device of this embodiment differs from that of Embodiment 1 in that: the clamping surfaces of the upper clamp and the lower clamp are respectively provided with two V-shaped notch grooves, The V-shaped notch grooves on the upper fixture and the lower fixture are in one-to-one correspondence, and the V-shaped notch grooves at the corresponding positions have the same structure, and the two V-shaped grooves on the upper fixture have different sizes. The dimensions of the two V-grooves are different.

[0024] The other structures of this embodiment are the same as those of Embodiment 1, and the method of use is also the same, which will not be repeated here. In this embodiment, the upper and lower clamps are respectively provided with two V-shaped notch grooves of different sizes, which can meet the use of samples of different structures, and are more convenient to use, convenient to clamp multiple irregular s...

Embodiment 3

[0026] The metallographic sample clamping device of this embodiment includes: an upper clamp and a lower clamp, and the clamping surfaces of the upper clamp and the lower clamp are provided with anti-slip protrusion structures. The corresponding positions on the upper and lower clamps are respectively provided with four through holes, and the four through holes on the upper and lower clamps are arranged symmetrically; the studs pass through the upper and lower clamps on the corresponding The through hole at the position, the nut is provided on the stud. Two V-shaped notch grooves are respectively provided at corresponding positions on the clamping surfaces of the upper clamp and the lower clamp. The V-shaped notch grooves on the upper and lower clamps are respectively arranged between two adjacent through holes. In this embodiment, the sizes of the two V-shaped grooves on the upper fixture are different, and the sizes of the two V-shaped grooves on the lower fixture are also ...

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Abstract

The invention discloses a metallographic specimen clamping device which comprises an upper clamp and a lower clamp. The upper clamp and the lower clamp are each provided with at least two through holes. The through holes in the upper clamp correspond to the through holes in the lower clamp one to one. Bolts penetrate through the through holes in the corresponding positions of the upper clamp and the lower clamp, and nuts are further arranged on the bolts. Anti-skid protruding structures are arranged on the opposite clamping faces of the upper clamp and the lower clamp. According to the metallographic specimen clamping device, specimen grinding time is saved, the work efficiency of specimen preparation is improved, and the labor intensity of workers is lowered.

Description

technical field [0001] The invention specifically relates to a metallographic sample clamping device. Background technique [0002] Optical metallographic microscope, scanning electron microscope and microhardness Instruments and other equipment are used to analyze and evaluate the metallographic microstructure, internal defect distribution characteristics, and hardness of material constituent phases inside the material, and the object and basis for studying and evaluating the microstructure of materials are metallographic samples. [0003] In order to observe multiple samples at one time and save experimental time, the metallographic samples used for SEM observation usually have strict requirements on the size. While ensuring the observation area, the height of the sample should not be too high, and in order to ensure the conductivity of the material, the sample cannot be inlaid, so there is inconvenient clamping during the sample preparation process, and the prepared samp...

Claims

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Application Information

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IPC IPC(8): G01N1/32B24B41/06
CPCG01N1/32B24B41/06
Inventor 孙旭宁玉恒李英明
Owner DATANG DONGBEI ELECTRIC POWER TESTING & RES INST
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