Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Perpendicularity measuring device

A measuring device and verticality technology, applied in the field of verticality measurement, can solve problems such as visual error, large environmental impact, and poor measurement accuracy, and achieve the effects of improving accuracy, avoiding deposition, and improving quality

Active Publication Date: 2016-08-31
CHENGDU FUTONG OPTICAL COMM TECH +1
View PDF6 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved and the technical task proposed by the present invention are to improve the existing technology and provide a verticality measuring device to solve the problem that the traditional way of measuring verticality in the current technology is greatly affected by the environment, has visual errors, and poor measurement accuracy The problem

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Perpendicularity measuring device
  • Perpendicularity measuring device
  • Perpendicularity measuring device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] A verticality measurement device disclosed in the embodiment of the present invention reduces the influence of environmental factors, eliminates visual errors during measurement, and effectively improves measurement accuracy, thereby ensuring that the verticality of the tower body can be adjusted to the best level, and the uniformity of deposition can be improved. Improve the stability of T / A parameters of the mandrel.

[0022] like Figure 1 to Figure...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Diameteraaaaaaaaaa
Login to View More

Abstract

The invention discloses a perpendicularity measuring device which comprises a holding platform and a plumb bob. The perpendicularity measuring device is characterized in that a plumb bob preformed opening is formed in the holding platform; the top of the plumb bob is fixed and vertically penetrates through the plumb bob preformed opening; two light sources are arranged on the holding platform; the light emitting directions of the light sources face to the plumb bob preformed opening and are perpendicular to each other; scale plates are arranged on opposite sides of the light emitting directions of the light sources; the plumb bob is positioned between the light sources and the scale plates; horizontal scales are arranged on the scale plates; scales on the two scale plates are positioned on a same horizontal plane; the holding plate is connected on the machine head of a tower body and moves up and down along with the machine head along a guide track; the projection scale values of the plumb bob on the scale plates are measured so as to test the perpendicularity of the tower body. By adopting the perpendicularity measuring device disclosed by the invention, the problem that relatively large read errors can be caused as the plumb bob is shaken when a conventional method is adopted to measure is solved, the measurement result precision is effectively improved, and the quality of deposit products is improved.

Description

technical field [0001] The invention relates to the technical field of measuring verticality, in particular to a verticality measuring device. Background technique [0002] The production of optical fiber preform and core rod is to spray silica dust through blowtorch, and then rotate and lift the seed rod at a constant speed, so that a silica loose body with uniform outer diameter is formed on the seed rod, and then sintered at high temperature to form the loose body Transparent glass body. The process of rotating and lifting is to use the power provided by the lifting motor to drive the machine head that hangs the seed rod through the screw rod, and rely on a set of guide rails installed on the tower body to lift in the vertical direction to complete the vapor deposition operation. The VAD deposition technology is axial vapor deposition, which mainly ensures the stability of the core layer and the cladding layer through the stability of the axial lift, and the influence fa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01C15/12
CPCG01C15/12
Inventor 冯杰陈剑
Owner CHENGDU FUTONG OPTICAL COMM TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com