Accurate calibration method for alpha spectrometry peak overlap correction factor of radon daughter measuring instrument

A calibration method and correction factor technology, applied in X-ray energy spectrum distribution measurement, etc., can solve the problems of electronic component loss, energy drift, etc., to improve measurement accuracy, reduce energy drift and α energy spectrum overlap correction deviation Effect
CN105954789AInactive Publication Date: 2016-09-21NANHUA UNIV

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
NANHUA UNIV
Publication Date
2016-09-21
Estimated Expiration
Not applicable · inactive patent

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Abstract

The present invention discloses an accurate calibration method for an alpha-spectrometry peak overlap correction factor of a radon daughter measuring instrument. A radon daughter measuring instrument samples from <220>Rn daughter measurement environment and stands, and then a channel value LV1, corresponding to an upper threshold of a <222>Rn daughter RaA (<218>Po) 6.0MeV spectrometry peak counting area, of the measuring instrument is calibrated by means of multiple channels. The radon daughter measuring instrument samples from pure <220>Rn daughter environment after refilled with a filter membrane. Alpha particle quantities N11 and N12 in a 6.0 MeV counting area and a 7.69 MeV counting area in the time period of 60-120 min are calculated by using the multiple channels, and a peak overlap factor theta1 is calculated. The radon daughter measuring instrument samples from pure <222>Rn daughter environment after the filter membrane is changed, and then a channel value LV2, corresponding to an upper threshold of a <222>Rn daughter RaC'(<214>Po) 7.69MeV spectrometry peak counting area, of the measuring instrument is calibrated by means of the multiple channels. The radon daughter measuring instrument samples from a <220>Rn chamber after being refilled with a filter membrane, alpha particle quantities N24, N23 and N22 are measured via a multi-channel pulse amplitude analyzer, and peak overlap factors theta2 and theta3 are determined.
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Description

technical field

[0001] The invention belongs to the technical field of radioactive inert gas measurement, and relates to an accurate calibration method for an alpha energy spectrum peak overlap correction factor of a radon daughter measuring instrument. Background technique

[0002] radon (including 222 Rn and 220 Rn) is a radioactive noble gas and is one of the main sources of natural radiation exposure. but 222 Rn / 220 The contribution of Rn daughters to the dose due to the environment is much greater than that of 222 Rn / 220 Rn, "Radon harm" is actually the harm of radon daughters to the human body. In order to accurately evaluate the environment 222 Rn / 220 Doses and hazards caused by Rn and its daughters need attention 222 Rn / 220 Method and device for measuring Rn daughter body.

[0003] Because the α energy spectrum method has the characteristics of good measurement accuracy, short measurement time, and strong retort ability, it is currently commonly used i...

Claims

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