Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Accurate calibration method for alpha spectrometry peak overlap correction factor of radon daughter measuring instrument

A calibration method and correction factor technology, applied in X-ray energy spectrum distribution measurement, etc., can solve the problems of electronic component loss, energy drift, etc., to improve measurement accuracy, reduce energy drift and α energy spectrum overlap correction deviation Effect

Inactive Publication Date: 2016-09-21
NANHUA UNIV
View PDF10 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, sometimes due to long-term use or improper use, the electronic components in the instrument are gradually worn out or damaged, and the gain and parameter values ​​​​of the preamplifier and linear amplifier have changed compared with the calibration, resulting in energy drift.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Accurate calibration method for alpha spectrometry peak overlap correction factor of radon daughter measuring instrument
  • Accurate calibration method for alpha spectrometry peak overlap correction factor of radon daughter measuring instrument
  • Accurate calibration method for alpha spectrometry peak overlap correction factor of radon daughter measuring instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0031] 222 Rn, 220 Calculation of overlap factor of Rn daughter α spectrum peak:

[0032] because 222 Rn, 220 The peak shape and position of each α energy spectrum peak of the Rn daughter body will not change greatly due to the environment and the continuous deposition of the daughter body, that is to say, the overlapping factor of the energy spectrum peak will not change due to the change of the environment, so this paper can Referring to the peak overlapping algorithm of Wang Jiaming and Lu Zhengyong, using pure 222 Rn daughter environment and pure 220 The environment of Rn daughters is determined separately 222 Rn, 220 When the Rn progeny concentration is high, the RaC'7.69MeVα particle energy spectrum peak counting area (referred to as the counting area) is to the RaA6.0MeV counting area, the ThC'8.78MeV counting area is to the 6.0...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention discloses an accurate calibration method for an alpha-spectrometry peak overlap correction factor of a radon daughter measuring instrument. A radon daughter measuring instrument samples from <220>Rn daughter measurement environment and stands, and then a channel value LV1, corresponding to an upper threshold of a <222>Rn daughter RaA (<218>Po) 6.0MeV spectrometry peak counting area, of the measuring instrument is calibrated by means of multiple channels. The radon daughter measuring instrument samples from pure <220>Rn daughter environment after refilled with a filter membrane. Alpha particle quantities N11 and N12 in a 6.0 MeV counting area and a 7.69 MeV counting area in the time period of 60-120 min are calculated by using the multiple channels, and a peak overlap factor theta1 is calculated. The radon daughter measuring instrument samples from pure <222>Rn daughter environment after the filter membrane is changed, and then a channel value LV2, corresponding to an upper threshold of a <222>Rn daughter RaC'(<214>Po) 7.69MeV spectrometry peak counting area, of the measuring instrument is calibrated by means of the multiple channels. The radon daughter measuring instrument samples from a <220>Rn chamber after being refilled with a filter membrane, alpha particle quantities N24, N23 and N22 are measured via a multi-channel pulse amplitude analyzer, and peak overlap factors theta2 and theta3 are determined.

Description

technical field [0001] The invention belongs to the technical field of radioactive inert gas measurement, and relates to an accurate calibration method for an alpha energy spectrum peak overlap correction factor of a radon daughter measuring instrument. Background technique [0002] radon (including 222 Rn and 220 Rn) is a radioactive noble gas and is one of the main sources of natural radiation exposure. but 222 Rn / 220 The contribution of Rn daughters to the dose due to the environment is much greater than that of 222 Rn / 220 Rn, "Radon harm" is actually the harm of radon daughters to the human body. In order to accurately evaluate the environment 222 Rn / 220 Doses and hazards caused by Rn and its daughters need attention 222 Rn / 220 Method and device for measuring Rn daughter body. [0003] Because the α energy spectrum method has the characteristics of good measurement accuracy, short measurement time, and strong retort ability, it is currently commonly used i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01T1/36
CPCG01T1/36
Inventor 吴喜军肖德涛李志强单健周青芝
Owner NANHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products