Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Voltage sag reason recognition method based on typical voltage sag waveform matching

A voltage sag and waveform matching technology, applied in character and pattern recognition, instruments, data processing applications, etc., can solve problems such as insufficient measured data, affecting the accuracy of recognition results, and accurate recognition results.

Inactive Publication Date: 2016-09-28
STATE GRID JIANGSU ELECTRIC POWER CO ELECTRIC POWER RES INST +2
View PDF3 Cites 25 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the above method, for the extraction of voltage sag feature quantities, generally no more than 10 feature quantities are extracted, and some feature quantities that are more important in actual situations cannot be well excavated, thus affecting the accuracy of the recognition results However, using methods such as fuzzy reasoning needs to set a certain threshold. In actual situations, the short-circuit capacity of the power system, the connection mode of the transformer, and the load type will all affect the characteristics of the voltage sag to a certain extent. Therefore, it is difficult to Determining a fixed threshold makes the recognition result very accurate; moreover, the neural network requires a large number of training samples, but the actual measured data is not rich enough in practice, which affects the application of the neural network method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Voltage sag reason recognition method based on typical voltage sag waveform matching
  • Voltage sag reason recognition method based on typical voltage sag waveform matching
  • Voltage sag reason recognition method based on typical voltage sag waveform matching

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] The present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.

[0051] Such as figure 1 As shown, the voltage sag cause identification method based on typical voltage sag waveform matching of the present invention includes the following steps,

[0052] Step (A), collecting historical monitoring waveforms of typical voltage sag historical events

[0053] Collect the historical monitoring waveforms of typical voltage sag historical events through the sag recorder, and extract the causes of voltage sags corresponding to the historical monitoring waveforms, and the causes of voltage sags, including the following six reasons: three-phase short-circuit fault, single-phase Phase-to-ground fault, two-phase to ground fault, phase-to-phase short-circuit fault, induc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a voltage sag reason recognition method based on typical voltage sag waveform matching, and the method comprises the following steps: (A), collecting a historical monitoring waveform of a typical voltage sag historical event; (B), building a typical voltage sag event waveform library; (C), extracting a to-be-extracted voltage sag waveform; (D), carrying out the waveform matching and analysis of the wave band of the to-be-extracted voltage sag waveform and the typical voltage sag event waveform library; (E), recognizing the generation reason of a current voltage sag event waveform. The method carries out the more fundamental and accurate matching analysis of the voltage sag at the aspect of waveform, can quickly and accurately recognize the generation reason of the voltage sag event waveform, has a very high reference value for the prevention and treatment of the voltage sag, and is good in application prospect.

Description

technical field [0001] The invention relates to a voltage sag cause identification method based on typical voltage sag waveform matching, and belongs to the technical field of power quality analysis. Background technique [0002] Voltage sag, also known as voltage sag, voltage sag or voltage sag, voltage sag is an event in which the root mean square value of the power supply voltage suddenly drops in a short period of time and then quickly returns to a normal state. The typical time is generally 0.5 to 30 cycles time. [0003] With the rapid development of the economy and the wide application of sensitive power electronic equipment in industry, the losses caused by voltage sags have also increased significantly. According to the survey of a foreign power company, complaints about voltage sags account for 80% of power quality complaints, and voltage sags have become the most important power quality problem. [0004] The main causes of voltage sags are divided into three cat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06Q50/06G06K9/62
CPCG06Q50/06G06F18/22
Inventor 陈兵顾伟史明明罗珊珊王旭冲储佳伟邱海峰吕振华
Owner STATE GRID JIANGSU ELECTRIC POWER CO ELECTRIC POWER RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products