A multi-type line width measurement method and device

Abstract

The embodiment of the invention discloses a method and device for measuring various types of line widths, and solves technical problems that a conventional measurement method through human eyes is large in error and low in efficiency, a technical problem that the actual value of a line width cannot be measured in a qualitative off-on test, and a technical problem that X-rays is poor in imaging effect for line conductors. The method comprises the steps: carrying out the preprocessing of a collected test image, and obtaining a characteristic value corresponding to a conductor edge contour in a test image; comparing the characteristic value with a preset prior characteristic value, and determining a prior characteristic class of a conductor according to the comparison result, wherein the prior characteristic class comprises optimal characteristics and non-ideal characteristics; and carrying out the corresponding line width calculation according to the determined prior characteristic class.

Description

technical field [0001] The invention relates to the technical field of PCB detection, in particular to a multi-type line width measurement method and device. Background technique [0002] With the continuous maturity of optical imaging equipment and the rapid development of computer vision technology, it has become an emerging development trend to use hardware equipment and software algorithms to freely match and combine in the field of PCB inspection to coordinate and complete efficient and high-quality inspection tasks. [0003] In view of the miniaturization and integration development trend of electronic product chips or the high-precision micro-gap of industrial equipment, the requirements for PCB are urgently reflected in the multi-layer and dense wiring of PCB. High-precision, thin wires, high density, and small spacing are developing in the direction of development, which leads to the fact that the characteristic impedance of the PCB board or the wire of the product ...

AI Technical Summary

Problems solved by technology

[0006] The embodiment of the present invention provides a multi-type line width measurement method and device, which solves the current technical problems of large error and low efficiency when the human eye measurement is used, and the qualitative on-off test cannot measure the line width size The technical problem of the actual value, and the technical problem of the X-ray imaging effect on the thin wire becomes worse

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