Quantitative detection method for surface defects of optical element with high-order curved surface
A quantitative detection method and high-order surface technology, which is applied in optical testing of flaws/defects, material analysis through optical means, measuring devices, etc., can solve the problems of inconsistent standards, poor repeatability, and strong subjectivity of visual methods
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[0043] Below, embodiment 1 of the present invention will use Figure 1-6 to describe in detail.
[0044] Such as figure 1 As shown, the quantitative detection method for surface defects of high-order curved optical components specifically includes the following steps:
[0045] Step 1. Obtain defect information on the full-aperture surface of the high-order curved optical element 40 by means of sub-aperture scanning and stitching. Based on the latitude and longitude line scanning trajectory method of high-order curved surface, the scanning path is optimized through sub-aperture planning and the spatial distribution of sub-apertures on the surface of high-order curved surface is determined, so as to cover the full aperture range of the measured component with a small number of sub-apertures; the said The high-order surface is a rotating high-order surface with the Z axis as the axis of rotation, including spherical surfaces, quadric surfaces (paraboloids, ellipsoids, etc.), hi...
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