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Testing method and terminal

A test method and terminal technology, applied in software testing/debugging, error detection/correction, instruments, etc., can solve the problems of long time consumption and low test efficiency, so as to solve the problem of long consumption time, save test time and improve efficiency Effect

Inactive Publication Date: 2016-10-26
SHENZHEN TINNO WIRELESS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the embodiment of the present invention provides a test method and device to solve the problems in the prior art that it takes too long to complete a CTS test and the test efficiency is low

Method used

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  • Testing method and terminal
  • Testing method and terminal
  • Testing method and terminal

Examples

Experimental program
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Embodiment 1

[0051] The embodiment of the present invention provides a test method, please refer to figure 1 , which is a schematic flow chart of Example 1 of the test method provided by the embodiment of the present invention, such as figure 1 As shown, the method includes the following steps:

[0052] S101. Divide at least two test packages into at least two test sets, each test set may contain at least one test package.

[0053] Specifically, the purpose of dividing at least two test packages into at least two test sets is to use at least two test sets to perform concurrent tests on at least two devices to be tested, so as to obtain test results and reduce test time.

[0054] Specifically, when the device to be tested is tested, at least two test packages can be used, and each test package includes at least one test item. In the embodiment of the present invention, all test items to be tested are divided into multiple test sets in units of test packages.

[0055] For example, if the ...

Embodiment 2

[0093] The embodiment of the present invention provides a test method, please refer to figure 2 , which is a schematic flow chart of Example 2 of the test method provided by the embodiment of the present invention, such as figure 2 As shown, the method includes the following steps:

[0094] S201. Divide at least two test packages into N test sets, where N is an integer greater than 1.

[0095] S202. Use N devices to be tested to concurrently test N test sets, so as to obtain N test reports.

[0096] S203, combining the obtained N test reports into a complete test report as a test result.

[0097] A technical solution in the embodiment of the present invention has the following beneficial effects:

[0098] In the embodiment of the present invention, at least two test packages are divided into at least two test sets, so that at least two test sets are concurrently tested by connecting at least two devices to be tested. The method for testing equipment to perform all tests, i...

Embodiment 3

[0100] Based on the test method provided by the first embodiment above, the embodiment of the present invention further provides a terminal embodiment for realizing each step and method in the above method embodiment. Please refer to image 3 , which is a functional block diagram of a terminal provided by an embodiment of the present invention. Such as image 3 As shown, the terminal includes:

[0101] A division module 31, configured to divide at least two test packages into at least two test sets, each test set may contain at least one test package;

[0102] The testing module 32 is configured to use at least two test sets to concurrently test at least two devices to be tested, so as to obtain test results.

[0103] In the embodiment of the present invention, the dividing module 31 is specifically used for:

[0104] According to the number of test items contained in each test package, at least two test packages are divided into at least two test sets, each test set may c...

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Abstract

The embodiment of the invention provides a testing method and a terminal. On one side, the method comprises the steps that at least two testing packages are divided into at least two testing sets, wherein each testing set can comprise at least one testing package; and then, the at least two testing sets are used to test at least two pieces of to-be-tested equipment concurrently, so that testing results can be obtained. Hence, the technical scheme provided by the embodiment of the invention can solve the problems in the prior art that one CTS test requires too much time, and testing efficiency is low.

Description

【Technical field】 [0001] The present invention relates to the technical field of terminals, in particular to a testing method and a terminal. 【Background technique】 [0002] For manufacturers, when electronic products are developed and their own Android system is developed, they must pass the latest Android Compatibility Test (Compatibility Test Suite, CTS) to ensure that standard Android applications can run on the Android system. under the system. After passing the CTS test, the test report needs to be submitted to Google. After Google confirms that there is no problem with the CTS test report of the electronic product, the electronic product can obtain the certification of the Android Market (Android Market), and the product can be launched. [0003] In the course of realizing the present invention, the inventor finds that there are at least the following problems in the prior art: [0004] With the continuous upgrade of the Android system, there are more and more compa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor 何小明
Owner SHENZHEN TINNO WIRELESS TECH