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System and method for verifying data holding capacity

A technology for verifying data and capabilities, applied in static memory, instruments, etc., can solve problems that are not conducive to the development of mass-produced product test programs and increase the complexity of program development, so as to save time and cost, simplify process procedures, and improve verification efficiency Effect

Inactive Publication Date: 2016-10-26
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

Among them, the second test program 102 realizes the waiting time by executing vectors, and the conversion between the three test programs greatly increases the complexity of program development, which is not conducive to the development of test programs for mass-produced products.

Method used

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  • System and method for verifying data holding capacity
  • System and method for verifying data holding capacity

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Embodiment Construction

[0029] In order to make the content of the present invention clearer and easier to understand, the content of the present invention will be further described below in conjunction with the accompanying drawings of the specification. Of course, the present invention is not limited to this specific embodiment, and general replacements well known to those skilled in the art are also covered by the protection scope of the present invention.

[0030] The following is attached Figure 1-2 The present invention is further described in detail with specific examples. It should be noted that the drawings all adopt a very simplified form and use non-precise proportions, and are only used to facilitate and clearly achieve the purpose of assisting the description of this embodiment.

[0031] In this example, please refer to figure 1 , A system for verifying data retention capabilities. The test device can be any device with data storage capabilities, such as memory chips; specifically including...

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Abstract

The invention provides a system and method for verifying data holding capacity. A variable voltage parameter setting port is used to set different voltages applied to test devices in a same test program, and a waiting time parameter setting interface is used to directly set waiting time; working voltage can be converted directly, waiting time can be set directly, with no need for adding additional test items to change the working voltage and the waiting time; the process procedures are simplified, time and cost are saved, and verifying efficiency is improved.

Description

Technical field [0001] The invention relates to the technical field of semiconductor technology, in particular to a system and method for verifying data retention capabilities. Background technique [0002] At present, in the chip function test, verifying the data retention capability is an important indicator of the test chip. The purpose of the data retention test is to ensure that the device can retain the data in the memory cell. Therefore, the test principle is: when the voltage Vcc is the chip's normal operating voltage Vnormal, write data to the memory cell, then gradually reduce the operating voltage to the minimum operating voltage Vmin, wait for a period of time, and then gradually increase the voltage to the normal operating voltage Vnormal , At this time, read the storage information of the storage unit to determine whether the storage information is the same. [0003] However, based on the standard method of the conventional test platform, if you want to change the t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/12
CPCG11C29/12005
Inventor 代瑞娟席与凌李强
Owner SHANGHAI HUALI MICROELECTRONICS CORP
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