Test fixture and test method

A test fixture and technology to be tested, applied in the field of testing, can solve the problems of scratching the appearance of power supply products, low test efficiency, etc., to achieve the effect of improving the test speed, reducing the number of plugging and unplugging, and avoiding damage

Inactive Publication Date: 2016-11-09
广东省博康电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this test method, the operator needs to plug and unplug the power supply product for a long time, which leads to low test efficiency and may cause scratches on the appearance of the power supply product

Method used

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  • Test fixture and test method
  • Test fixture and test method
  • Test fixture and test method

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Embodiment Construction

[0026] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, and are not intended to limit the present invention.

[0027] The invention provides a test fixture.

[0028] refer to figure 1 , figure 1 This is a schematic diagram of a three-dimensional structure of an embodiment of the test fixture of the present invention.

[0029] The test fixture of this embodiment includes a base 100 , a connecting component 200 and a plug 300 .

[0030] The connection assembly 200 is at least two groups; each group of the connection assembly 200 includes a socket 220, a connection interface 240 and a connector 260; The test product is powered; the connection interface 240 is used to be connected to the...

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Abstract

The invention discloses a test fixture and a test method. The test fixture comprises a base, connecting components and a plug. Each connecting component comprises a socket, a connecting interface and a connector. The socket is used for installing a product to be tested and supplying power to the product to be tested. The connecting interface is used for being connected with the output end of the product to be tested. One end of the connector is electrically connected with the connecting interface, and the other end is used for being electrically connected with a test device so as to transmit the electric signals outputted by the product to be tested to the test device. One end of the plug is electrically connected with the socket, and the other end is used for being electrically connected with an external power supply so as to supply power to the socket. According to the technical scheme, multiple sets of connecting components are arranged on the same base, each connecting component can perform installation testing on one power supply product, and the whole set of the power supply product is directly moved to the next test position without unplugging the power supply product when testing of the test position is completed so that the plugging frequency of the power supply product can be effectively reduced, test speed can be enhanced and the appearance beauty of the power supply product can be guaranteed.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a testing fixture and a testing method. Background technique [0002] With the development of the electronic market, more and more mobile terminals (such as mobile phones, tablet computers, etc.) have entered people's daily life. Power supply products are also indispensable as accessory products of mobile terminals. [0003] Before the power supply products go on the market, they need to go through strict tests to ensure that they are high-quality products. The quality of power supply products is generally reflected in its anti-aging performance. Existing manufacturers of power supply products, after the production of the power supply products, first test whether they can work normally, and then test their aging resistance if they can work normally. In the process of testing whether it can work normally, the existing method is: electrically connect the power supply product to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04G01R31/40
CPCG01R1/0408G01R31/40
Inventor 陈希龄
Owner 广东省博康电子有限公司
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