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Scanning structure for scanning tunnel microscope

A technology for scanning tunnels and microscopes, applied in the field of scanning structures, can solve problems such as changes in detection data, achieve accurate detection data, reliable installation methods, and ensure accuracy

Inactive Publication Date: 2016-11-16
苏州衡微仪器科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the scanning process, if the tip of the needle deviates slightly, it will cause a great change in the detection data.

Method used

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  • Scanning structure for scanning tunnel microscope

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Embodiment Construction

[0019] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings.

[0020] see figure 1 As shown, a scanning structure of a scanning tunneling microscope includes a "U"-shaped base 1, a probe mounting platform 2 detachably installed on the base 1 in the horizontal direction, and the scanning structure also includes several electrode groups, Each electrode group includes an electrode 4 inserted vertically on the probe mounting platform 2, an elastic member 5 mounted on the base 1 and located below the probe mounting platform 2, specifically, the probe mounting platform 2 is provided with a number of electrode installation holes extending in the vertical direction, and then the electrode 4 is inserted into the electrode installation hole to complete the installation, and the electrode 4 is insulated from the probe installation platform 2 at the same time. Here, the elastic member 5 presses against the electrode...

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Abstract

The invention discloses a scanning structure for a scanning tunnel microscope, and the structure comprises a base and a probe installation platform which is detachably disposed on the base in a horizontal direction. The structure also comprises a plurality of electrode groups, and each electrode group comprises an electrode which is vertically inserted on the probe installation platform and an elastic part which is disposed on the base and is located below the probe installation platform. The elastic parts presses the electrodes, and the elastic parts are conductive and are insulated with the base. The structure enables the probe installation platform to be fixed simply and effectively through setting the conductive elastic parts, guarantees that a probe will not move in a detection process, and improves the accuracy of detection data. Meanwhile, the probe is connected with the electrodes, thereby providing more experiment conditions for the probe.

Description

technical field [0001] The invention relates to the field of vacuum equipment, in particular to a scanning structure of a scanning tunneling microscope. Background technique [0002] Scanning tunneling microscopy (STM) characterizes the morphology of samples by using the tunneling current on the probe and the sample surface as a feedback signal. According to the quantum effect, the tunneling current is exponentially related to the distance between the probe and the sample surface. Therefore, using the tunneling current as a feedback signal makes the scanning tunneling microscope have extremely high spatial resolution and can realize real-space atomic-level imaging of the sample. At the same time, by changing the tunneling conditions, the electronic structure of the sample surface can be measured in micro-regions. In recent years, people have successfully realized the measurement of the magnetization direction of the sample by using the tunnel magnetoresistance effect, tha...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q60/10
CPCG01Q60/10
Inventor 张磊
Owner 苏州衡微仪器科技有限公司