High-frequency transformer common-mode noise testing method

A high-frequency transformer and common-mode noise technology, applied in the field of high-frequency transformer common-mode noise testing, can solve problems such as affecting the use of mobile phones and tablet computers, difficult to control the size of high-frequency transformer common-mode noise, and practical interference of mobile phones and tablets. , to achieve the effect of an excellent test method

Inactive Publication Date: 2016-11-23
WUHAN UNIV OF TECH
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Problems solved by technology

Due to structural defects in this circuit, it is difficult to control the magnitude of the common-mode noise of the high-frequency transformer
[0003] For the common-mode noise of high-frequency transformers, it seriously affects the use of mobile phones and tablet computers. The signal of common-mode noise transmits small signals to the ground through the touch screen and hand or stylus. This path will affect the practicality of mobile phones and tablets. Cause serious

Method used

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  • High-frequency transformer common-mode noise testing method

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Embodiment Construction

[0035] The invention relates to a method for testing common mode noise of a high-frequency transformer. The test method uses an NEC555 chip to generate a square wave signal with a voltage of 12V, a frequency of 100K, and a duty ratio of 50% to drive the voltage change point of the voltage winding of the transformer. , wherein, the drive signal drives the voltage change point 2 of the first primary winding of the transformer through R1, the voltage constant points of the first primary winding and the second primary winding are both grounded, and the voltage change point 3 of the second primary winding is suspended , the voltage change point 5 of the secondary winding is suspended in the air, the voltage constant point is connected to the GND of the second primary winding voltage constant point 4 through a resistor Rsense equal to 100K, and the voltage waveform at both ends of the Rsense resistor is observed with an oscilloscope, which can be obtained The size of the common mode ...

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Abstract

The invention relates to a high-frequency transformer common-mode noise testing method. The method specifically comprises the steps that a transformer is independently split out, common-mode noise of the high-frequency transformer is judged through a common-mode noise testing circuit, the testing circuit is a square-wave generator composed of an NEC555 main circuit and an external circuit, the transformer and a driving and detection circuit for signals of the transformer. The method is used for high-frequency transformer common-mode noise interference test, during testing, the common-mode noise generated by the transformer body can be known only by testing pins of the transformer bod, and during actual application, a common-mode noise amplitude value of a power source body can be basically judged only by testing a common-mode noise amplitude value of the transformer body; in other words, the method can provide quite reliable testing method and means for the front end of the final testing of power source common-mode noise, is of a great significance in power source quality control, and can generate large economic benefits.

Description

technical field [0001] The invention relates to a method for testing common-mode noise of a high-frequency transformer, which belongs to the field of power supply equipment. Background technique [0002] Ordinary high frequency transformer working circuit, such as figure 1 As shown, the circuit is mainly composed of two parts: bridge module and transformer signal drive and detection, which transfer energy to the secondary output through the winding of the transformer. Due to structural defects in this circuit, it is difficult to control the size of the common-mode noise of the high-frequency transformer. [0003] For the common-mode noise of high-frequency transformers, it seriously affects the use of mobile phones and tablet computers. The signal of common-mode noise transmits small signals to the ground through the touch screen and hand or stylus. This path will affect the practicality of mobile phones and tablets. Cause serious interference, most power transformers have...

Claims

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Application Information

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IPC IPC(8): G01R29/26
CPCG01R29/26
Inventor 刘教瑜肖杰吴亮邱宏超葛宗诚
Owner WUHAN UNIV OF TECH
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