Method and system for detecting device state based on working condition data
A technology for working condition data and detection equipment, applied in neural learning methods, character and pattern recognition, instruments, etc., can solve problems such as affecting accuracy, inappropriate data preprocessing methods, and different health status contributions are not considered.
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[0042] In order to make the purpose, method scheme and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and methods are omitted to avoid unnecessarily obscuring the concept of the present invention.
[0043] It should be noted that the self-organizing map SOM (self-organizing map) is a competitive neural network proposed by Professor Kohonen, a neural network expert at the University of Helsinki in the Netherlands, in 1982, so it is also called Kohonen self-organizing feature map. It simulates the learning process of neuron cells in the brain and is an unsupervised learning method. While quantizing the data vector, the SOM a...
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