Application program testing method and device
A technology of application programs and test methods, applied in the computer field, can solve problems such as excessive file size, impact on the security of the application program under test, error detection, etc., and achieve the effect of avoiding adverse effects
Active Publication Date: 2020-04-28
TENCENT TECH (SHENZHEN) CO LTD
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Problems solved by technology
[0005] In order to solve the problem that the related technology adopts the method of integrating the SDK in the application program under test for error detection, the file of the application program under test is too large and the security of the application program under test is affected, the embodiment of the present invention provides a Application program testing method and device
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[0025] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0026] Please refer to figure 1 , which shows a schematic diagram of an implementation environment involved in an embodiment of the present invention. The implementation environment may include at least one terminal 120 and a testing platform 140 . in:
[0027] A test application program and a tested application program run in the terminal 120, and the test application program is used to detect errors of the tested application program. In the embodiment of the present invention, the test application program mainly performs Crash type error detection and / or ANR (Application Not Responding, application program no response) type error detection on the tested application program. The test application and the application under test are i...
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The invention discloses an application program test method and an application program test device, and belongs to the technical field of computers. The method is applied to equipment in which a test application program and a tested application program operate separately. The method comprises the following steps: acquiring mistake record information recorded by an operating system of the equipment through the test application program; detecting whether the tested application program makes a mistake of a target type according to the mistake record information; if the tested application program makes a mistake of the target type, acquiring scene information corresponding to the mistake of the target type through the test application program. The application program test method solves the problems that a file of the tested application program is oversized and the security of the tested application program is affected due to the fact that mistake detection is carried out in the tested application program by an integrated SDK mode in the relevant technology; the test application program does not need to be integrated on the tested application program, and a configuration file of the tested application program does not need to be modified neither, so that the adverse effect on the tested application program is fully avoided.
Description
technical field [0001] The invention relates to the field of computer technology, in particular to an application program testing method and device. Background technique [0002] In order to detect errors that may occur during the running of the application, some program developers or test platforms use the method of integrating SDK (Software Development Kit, software development kit) in the application. The SDK integrated in the application Used to implement error detection and reporting functions. [0003] Taking the error detection of the Crash type that may occur during the running of the application under test as an example, in related technologies, technicians pre-develop the SDK for realizing the error detection and reporting functions of the Crash type, and then The SDK is integrated into the application under test, and the configuration file of the application under test is modified to ensure that the SDK can run normally. After the application under test is downl...
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IPC IPC(8): G06F11/36
Inventor 符阳辉王寸涛
Owner TENCENT TECH (SHENZHEN) CO LTD