Method and device for testing EEPROM cell current in non-contact iC card

Abstract

The invention relates to a method and device for testing an EEPROM cell current in a non-contact iC card. The method comprises the steps that a test command cmd71 is defined on the basis of an iSO-14443 protocol, and a byte address and a bit address which need to be tested are defined in command parameters of the test command; a standard read command cmd30 is sent, command parameters of the read command are decoded, and a page address needing to be tested is obtained and checked; the test command cmd71 is sent, an address of a storage unit of EEPROM with a cell current needing to be tested is generated by combining the page address with the byte address and the bit address, and the cell current is tested through a current test port of EEPROM. The test device comprises a 14443 command decoding unit, a parameter decoding unit, a parameter register, a parameter combination unit, a control unit and an EEPROM interface control unit. According to the method and device for testing the EEPROM cell current in the non-contact iC card, by means of the command combination based on the iSO-14443 protocol, the bit position of EEPROM needing to be tested can be positioned conveniently, it is very helpful to test of the cell current of EEPROM, and the method and device have the advantages of saving time, improving the efficiency, being accurate and convenient and the like.

Description

technical field [0001] The invention belongs to the field of testing EEPROM in a non-contact IC card, and specifically relates to a method and a device for testing the EEPROM cell current in a non-contact IC card. Background technique [0002] The ISO-14443 protocol is a non-contact IC card standard protocol, which consists of four parts, which define the physical characteristics, spectrum power and signal interface, initialization and anti-collision algorithm, and communication protocol. Contactless IC card chips based on the ISO-14443 protocol are widely used in personal identification, library management, meeting sign-in, access control and other fields. [0003] The full name of EEPROM is Electrically Erasable Programmable Read-Only Memory, which is a general term for a kind of memory. The characteristic of this kind of memory is that the stored data can be read, written and erased by electrical signals. Due to the high reliability and complex structure of EEPROM, the ...

AI Technical Summary

Problems solved by technology

Due to the high reliability and complex structure of EEPROM, the capacity is usually relatively small

[0004] In the non-contact IC card, EEPROM has a dedicated cell current test port (v_cur). Sometimes it is necessary to test the cell current of the EEPROM to determine whether the EEPROM is in a normal working state, especially to locate a certain bit in the entire storage unit. situation, but because the ISO-14443 protocol does not specify the command to test the cell current of the EEPROM, the test is relatively difficult

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