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An rcs Extraction Algorithm for Target Strong Scattering Source

A strong scattering and target technology, applied in the field of target strong scattering source RCS extraction algorithm, can solve the problems of limited applicability, inability to analyze complex scattering mechanism, and inability to obtain RCS at the same time, so as to achieve the effect of expanding the scope of application

Active Publication Date: 2019-01-04
SHANGHAI RADIO EQUIP RES INST
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Problems solved by technology

This method can realize the RCS solution for strong scattering sources such as flat plates and multiple reflection structures, but cannot analyze complex scattering mechanisms such as spire diffraction and creeping waves.
At the same time, this method needs to use special programs to solve the various scattering components independently, and it is impossible to obtain the RCS of various scattering components in complex targets at the same time.
Therefore, the applicability of the technique is greatly limited

Method used

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  • An rcs Extraction Algorithm for Target Strong Scattering Source
  • An rcs Extraction Algorithm for Target Strong Scattering Source
  • An rcs Extraction Algorithm for Target Strong Scattering Source

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Embodiment Construction

[0052] The present invention will be further elaborated below by describing a preferred specific embodiment in detail in conjunction with the accompanying drawings.

[0053] Such as Figure 11 As shown, a target strong scattering source RCS extraction algorithm, the method includes the following steps:

[0054] S1, modeling the one-dimensional range image of the target;

[0055] S2, according to the analysis of the various scattering mechanisms of the target and its radial position (in this embodiment, the creeping wave scattering of the cone-sphere target, the scattering at the discontinuity between the cone and the hemisphere, and the peak diffraction are analyzed ), establish the mapping relationship between various scattering mechanisms in the target and each peak in the one-dimensional range image, and extract the one-dimensional range image corresponding to each scattering mechanism;

[0056] S3. According to the extraction result of the one-dimensional range image corre...

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Abstract

The invention discloses an RCS extraction algorithm for strong scattering sources in a target. The algorithm includes the following steps that firstly, modeling is carried out on the one-dimensional range profile of the target; secondly, according to analysis of various scattering mechanisms existing in the target and the radial positions of the scattering mechanisms, the mapping relation between the scattering mechanisms in the target and peak values in the one-dimensional range profile is established, and the one-dimensional range profile corresponding to the scattering mechanisms is extracted; thirdly, according to the extraction result of the one-dimensional range profile corresponding to the strong scattering sources in the target, the discrete Fourier transform processing method is adopted to acquire the RCS corresponding to the strong scattering sources. According to the algorithm, the RCS corresponding to the multiple strong scattering sources in the target can be acquired at the same time by carrying out inversion on one radar image, and the application range is greatly expanded.

Description

technical field [0001] The invention relates to the field of radar target characteristic modeling, in particular to an RCS extraction algorithm for strong target scattering sources. Background technique [0002] The radar cross section (Radar Cross Section, RCS) analysis and estimation of the target is based on various electromagnetic scattering theories to study the various mechanisms of the scattering field generated by the target, and uses various approximate calculation methods and computer technology to quantitatively estimate the electromagnetic scattering characteristics of the target. The main scattering mechanisms of typical targets include specular reflection, edge diffraction, peak or corner diffraction, creeping wave or creeping wave diffraction, traveling wave diffraction, multiple reflections between components, cavity scattering, antenna mode reflection, etc. The research on the scattering mechanism of various typical targets can provide data sources for near-...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S7/41G01S13/89
CPCG01S7/418G01S13/89
Inventor 谢志杰蔡昆高伟王晓冰
Owner SHANGHAI RADIO EQUIP RES INST