Broadband big power test clamp

Abstract

The invention discloses a broadband big power test clamp. The broadband big power test clamp comprises a circuit sheet fixed on a structure member; a microwave coaxial connector is welded on the circuit sheet through an insulator to form a microwave signal path; an impedance conversion line, a DC offset line and a grounding line are manufactured on a circuit sheet; the DC power supply pedestal is welded on the circuit sheet through a lead; chip-type microwave broadband capacitors are arranged on an input end and an output end of the clamp; a filtering capacitor is connected between the DC offset line and the grounding line of the circuit sheet through a scolding tin welding mode; and a chip-type resistor and an electrolytic capacitor are arranged on the circuit sheet through the soldering tin welding mode. Compared with the prior art, the beneficial effects of the broadband big power test clamp are that: through analogue simulation of ADS software, an in-band gain sink of the broadband big power test clamp can be effectively eliminated and the gain flatness can be improved. The broadband big power test clamp can effectively inhibit the in-band sink of the broadband big power test clamp and improves the in-band gain flatness.

Description

technical field [0001] The invention relates to the field of microwave high-power load pulling and related testing, in particular to a broadband high-power testing fixture. Background technique [0002] In the load pull system or other related test systems, it is necessary to convert the power tube to be tested (non-coaxial microwave device) into a coaxial interface using a microwave test fixture, so as to further use coaxial interface-based instruments such as vector network analyzers and spectrum analyzers The instrument performs measurement and analysis on the DUT. [0003] At present, typical broadband high-power tests mainly have the following characteristics: [0004] 1. Multi-section impedance transformation line, which transforms the 50 ohm impedance of the coaxial interface into a smaller impedance, generally about 10 ohms or 8 ohms. This is because the impedance of the input and output terminals of microwave high-power devices is relatively small, and impedance t...

AI Technical Summary

Problems solved by technology

This is because the commonly used Bias Tee cannot withstand the power enough to meet the test requirements of hundreds of watts microwave power devices, while the quarter-wavelength bias line can withstand higher currents to provide DC power for high-power DUTs loop

[0006] The above technologies have the following shortcomings and deficiencies: the quarter-wavelength bias line will severely limit the available bandwidth of the fixture. Generally speaking, its available bandwidth is only ±10% of the frequency point corresponding to the quarter-wavelength

Due to the extremely high precision requirements of microwave testing, artificially adjusting the position of the filter capacitor will lead to great test uncertainty and reduce the service life of the fixture

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