sot shape integrated circuit chip test and sorting device

Abstract

The invention discloses a testing and sorting device for an SOT outline integrated circuit chip. The testing and sorting device comprises a feeding mechanism, a testing track, a separator, a classified storage module, an industrial personal computer and a plurality of test stations, wherein the start end of the testing track is adjacent to the feeding mechanism; the tail end of the testing track is adjacent to the classified storage module; when the device is in work, the separator is used for controlling conveying of a micro-chip on the testing track so that the chip can orderly reach each test station; the test stations are sequentially arranged at the testing track; each test station is provided with a testing clamping piece and a chip retaining needle; when the micro-chip reaching on test station is to be tested, the testing clamping piece is used for clamping lead pins of the micro-chip and testing the chip; when the micro-chip reaching one test station needs not to be tested, the chip retaining needle of the corresponding test station is used for controlling the conveying of the micro-chip at the corresponding test station; the tested chip is led in a chip storage box corresponding to a test result by the classified storage module. The testing and sorting device disclosed by the invention is capable of optimizing the micro-chip and is capable of detecting the micro-chip efficiently.

Description

technical field [0001] The invention relates to chip processing equipment, in particular to a testing and sorting device for SOT-shaped integrated circuit chips. Background technique [0002] With the expansion of the application field of micro-integrated circuit chips and the increase of chip types, the detection of chips has become an important task. Due to the small size of micro-chips (SOT-shaped integrated circuit chips), it is difficult for automatic testing tasks to transmit, Positioning causes certain difficulties and directly affects the efficiency of chip detection. How to design good automatic detection equipment to solve these problems is a research direction. Contents of the invention [0003] The invention proposes an SOT shape integrated circuit chip testing and sorting device, which is optimized for micro chips and can efficiently detect micro chips. [0004] The present invention adopts the following technical solutions. [0005] The SOT shape integrated...

AI Technical Summary

Problems solved by technology

[0002] With the expansion of the application field of micro-integrated circuit chips and the increase of chip types, the detection of chips has become an important task. Due to the small size of micro-chips (SOT-shaped integrated circuit chips), it is difficult for automatic testing tasks to transmit, Positioning causes certain difficulties, which directly affects the efficiency of chip detection. How to design good automatic detection equipment to solve these problems is a research direction

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