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An on-chip self-triggering single event transient pulse width measurement method and system

A single-event transient and pulse width technology, which is applied in the direction of pulse characteristic measurement, measuring device, and electrical variable measurement, can solve the problem of inability to measure narrow pulse width, etc., and achieve the goal of reducing design difficulty, simple structure, and reducing design difficulty Effect

Active Publication Date: 2018-11-23
NORTHWEST INST OF NUCLEAR TECH +1
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AI Technical Summary

Problems solved by technology

It solves the problem that the existing on-chip self-trigger single-event transient pulse width measurement cannot measure narrow pulse width, and simplifies the circuit design for self-trigger signal generation, reducing the circuit area consumption caused by self-trigger signal delay

Method used

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  • An on-chip self-triggering single event transient pulse width measurement method and system
  • An on-chip self-triggering single event transient pulse width measurement method and system
  • An on-chip self-triggering single event transient pulse width measurement method and system

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Embodiment Construction

[0036] Referring to the accompanying drawings, a self-triggering single-event transient pulse width measurement system on a chip includes a combinational logic circuit; the above-mentioned combinational logic circuit includes a target circuit module 1, a gating circuit module 2, a single-event transient pulse width measurement module and a time delay Unit delay time calibration module 5;

[0037] The above-mentioned target circuit module 1 includes a plurality of combinational logic unit chains with different structural types;

[0038] The gating circuit module 2 is used to select the output of a combinatorial logic chain from the target circuit module, as the input signal of the subsequent pulse width measurement circuit;

[0039] The above-mentioned single-event transient pulse width measurement module includes a wide pulse width measurement unit 3 and a narrow pulse width measurement unit 4; the above-mentioned wide pulse width measurement unit 3 is used to measure a single...

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Abstract

The invention relates to an on-chip self-triggering single event transient pulse width measurement method and system. The system comprises a combined logic circuit which includes a target circuit module, a gating circuit module, a single event transient pulse width measurement module and a time-delay unit time delay calibration module. The invention provides the on-chip self-triggering single event transient pulse width measurement method and system characterized in that the self-triggering signal generation circuit is simple in structure and no special delay design is required.

Description

technical field [0001] The invention belongs to the field of single-particle transient pulse measurement, and relates to a single-particle transient pulse measurement method and system, in particular to an on-chip self-triggering single-particle transient pulse width measurement method and system. Background technique [0002] The radiation reliability problem caused by soft errors caused by single-event transient pulses of combinational logic circuits becomes more and more serious with the improvement of integrated circuit process nodes. The single-event transient pulse width is an important parameter to measure the possibility of soft errors caused by single-event transients. The wider the pulse width, the greater the probability that a single-event transient pulse will cause soft errors. Therefore, it is very meaningful to accurately measure the transient pulse width of single events, covering the range from narrow pulse width to wide pulse width. At the same time, it i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/02
CPCG01R29/023
Inventor 陈荣梅陈伟沈忱郭晓强郭红霞丁李利赵雯刘以农
Owner NORTHWEST INST OF NUCLEAR TECH
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