On-chip self-triggering single event transient pulse width measurement method and system

Abstract

The invention relates to an on-chip self-triggering single event transient pulse width measurement method and system. The system comprises a combined logic circuit which includes a target circuit module, a gating circuit module, a single event transient pulse width measurement module and a time-delay unit time delay calibration module. The invention provides the on-chip self-triggering single event transient pulse width measurement method and system characterized in that the self-triggering signal generation circuit is simple in structure and no special delay design is required.

Description

technical field [0001] The invention belongs to the field of single-particle transient pulse measurement, and relates to a single-particle transient pulse measurement method and system, in particular to an on-chip self-triggering single-particle transient pulse width measurement method and system. Background technique [0002] The radiation reliability problem caused by soft errors caused by single-event transient pulses of combinational logic circuits becomes more and more serious with the improvement of integrated circuit process nodes. The single-event transient pulse width is an important parameter to measure the possibility of soft errors caused by single-event transients. The wider the pulse width, the greater the probability that a single-event transient pulse will cause soft errors. Therefore, it is very meaningful to accurately measure the transient pulse width of single events, covering the range from narrow pulse width to wide pulse width. At the same time, it i...

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Problems solved by technology

It solves the problem that the existing on-chip self-trigger single-event transient pulse width measurement cannot measure narrow pulse width, and simplifies the circuit design for self-trigger signal generation, reducing the circuit area consumption caused by self-trigger signal delay

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