The invention relates to a high-speed
yaw scanning control device for testing quality of
electron beam current. A complicated
programmable logic device is respectively connected with a
serial communication circuit and the like; the
serial communication circuit is connected with an industrial control computer; two synchronous waveform generating circuits respectively comprise a digital to analog conversion circuit, a low-pass filter circuit, a photoelectric isolation circuit and a power amplifying circuit; two power amplifying circuits are connected with an electromagnetic deflection coil; the frequency of a
clock circuit is distributed by the complicated
programmable logic device; a
clock used for generating various frequencies is respectively used for
serial communication, control of a collecting card, and generation of frequency-variable waveforms; the industrial control computer is used for controlling the complicated
programmable logic device by the serial communication circuit; the complicated programmable logic device is used for generating the digital quantity of two waveforms under the triggering of the
clock circuit; and an amplified
signal is used for driving the electromagnetic deflection coil to generate a
magnetic field so as to scan the deflection of an
electron beam. The device has high control accuracy for scanning the deflection of the
electron beam; and a digital circuit can largely enhance the anti-disturbance capability of the device.