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Product testing method and device

A product testing and product technology, applied in the field of testing, can solve problems such as mistesting, product defect finding rate and test accuracy reduction, and increased tester fatigue

Active Publication Date: 2017-02-22
福建中金在线信息科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, repeated tests in stages, test pages, test function items, and the continuous repetition of the test process will easily lead to increased fatigue of the testers, causing problems such as missed tests and wrong tests during the test process, or it is not easy Discover potential product defects, leading to a decrease in product defect finding rate and test accuracy, which in turn leads to a decrease in product quality

Method used

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Embodiment Construction

[0069] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0070] The embodiment of the present invention discloses a product testing method, which will be described in detail below.

[0071] see figure 1 , figure 1 It is a flowchart of a product testing method according to an embodiment of the present invention, which is applied to product testing and includes the following steps:

[0072] Step 101 , after a preset first test time, acquire and according to the instruction of the current tester to complete the syste...

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Abstract

The embodiment of the invention provides a product testing method and device. The method comprises the steps that after a first testing time, an instruction that system testing of a product is completed by current testing personnel is acquired, and it is detected that the product has a first defect; a first repairing instruction used for repairing the first defect is generated; after the first defect is repaired, an instruction that retesting of the first defect and summary system testing of the product are completed by the current testing personnel is acquired after a second testing time, and it is detected that the product has a second defect; a second repairing instruction used for repairing the second defect is generated; after the second defect is repaired, an instruction that retesting of the first defect and the second defect is completed by the current testing personnel is acquired in a third testing time, an instruction that the current testing personnel are replaced and an instruction that summary testing of the product is performed by testing personnel obtained after replacing are generated, and then the testing personnel obtained after replacing can perform summary testing on the product according to a summary testing instruction.

Description

technical field [0001] The invention relates to the testing field, in particular to a product testing method and device. Background technique [0002] In modern industrial and technological production, after the product is manufactured, various tests will be performed on product performance to detect product defects and repair the defects. By repairing defects, the purpose of improving product quality is achieved. Modern society has increasingly demanding product quality. There is an urgent need for product testing methods that can provide higher defect finding rates and testing accuracy. [0003] At present, the existing product testing methods have been improved in this regard. The existing product testing methods divide the testing process into three stages. The first stage: conduct product system testing according to the set test cases, and record the defects generated by the first stage of testing. ;Second stage: After the developers repair the defects of the first sta...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3672
Inventor 沈文策
Owner 福建中金在线信息科技有限公司