Image identification method, metric learning method, image source identification method and devices
An image recognition device and image recognition technology, applied in the field of pattern recognition, can solve the problems of low image recognition accuracy and the like
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0138] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the application. However, the present application can be implemented in many other ways different from those described here, and those skilled in the art can make similar promotions without violating the connotation of the present application. Therefore, the present application is not limited by the specific implementations disclosed below.
[0139] In this application, an image recognition method and device, a metric learning method and device, and an image source recognition method and device are respectively provided, which will be described in detail in the following embodiments one by one.
[0140] Although the technical solution of this application is proposed in the background of face recognition, the application field of the technical solution of this application is not limited to face recognition, and the technical solution provided by this appli...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com