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A photoelectric product infrared imaging delay test device

A technology of optoelectronic products and testing devices, which is applied in the direction of TV, electrical components, color TV, etc., to achieve the effect of high-precision measurement

Active Publication Date: 2018-05-15
LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem of lack of a device for testing the infrared imaging delay index of optoelectronic products in the prior art, the present invention proposes a test device for infrared imaging delay of optoelectronic products

Method used

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  • A photoelectric product infrared imaging delay test device

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Embodiment Construction

[0018] The embodiments of the present invention are described in detail below, and the embodiments are exemplary and intended to explain the present invention, but should not be construed as a limitation of the present invention.

[0019] like figure 1 As shown, the present invention provides an infrared imaging delay testing device for optoelectronic products, which includes a target source, a light shield, a high-precision synchronous clock, an imaging delay recording system and a tripod.

[0020] The photoelectric product under test is placed in front of the target source, and the photoelectric product under test is connected to the imaging delay recording system, and the photoelectric product under test outputs the collected image signal to the imaging delay recording system.

[0021] The target source is composed of a mid-infrared LED array and is placed in the hood to reduce the influence of external stray light on the test results during the test.

[0022] The photoele...

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Abstract

The invention proposes an infrared imaging delay test device for optoelectronic products, including a target source, a hood, a high-precision synchronous clock, an imaging delay recording system, and a tripod; the optoelectronic product under test is placed directly in front of the target source, and the output of the optoelectronic product under test is collected The image signal is sent to the imaging delay recording system; the target source is composed of a mid-infrared LED array, which is placed in the hood; the high-precision synchronous clock is respectively connected to the photoelectric product under test and the imaging delay recording system; the photoelectric product under test provides a trigger signal to the high Accurate synchronous clock, high-precision synchronous clock records the starting time of imaging; the imaging delay recording system processes the image signal input by the photoelectric product under test, and records the time of obtaining a clear image according to the high-precision synchronous clock; calculates the starting time of imaging and obtains a clear image The interval between the moments of the images yields the imaging delay time of the optoelectronic product under test. The invention realizes the rapid and high-precision measurement of the infrared imaging delay of the photoelectric product.

Description

technical field [0001] The invention relates to the technical field of optoelectronic product testing, in particular to an infrared imaging delay testing device for optoelectronic products. Background technique [0002] Since the take-off and landing of the aircraft are mainly completed by the pilot's observation of the runway, in the event of bad weather conditions, once the pilot's line of sight is blocked, the aircraft will not be able to take off or land smoothly, bringing danger. [0003] In view of the above situation, it is currently proposed to equip the aircraft with an infrared vision enhancement system, that is, to provide the pilot with an observation video through the infrared observation camera installed in the front of the aircraft to assist the pilot to observe the runway conditions during take-off and landing. However, because video images have a certain delay in transmission, if the delay is large, it will cause wrong observation to the pilot. Therefore, ac...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N17/00H04N5/225H04N5/33
CPCH04N5/33H04N17/00H04N17/002H04N23/56
Inventor 邱龙甲李艳晓杜保林
Owner LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC