Method and system for determining parallelism of lens plane and test chart plane

A technology of plane parallelism and parallelism, which is applied in the field of judging the parallelism between the lens plane and the plane of the test chart, can solve the problems that the parallelism cannot be quantified, and achieve the effects of eliminating subjective factors, controllable precision, and strong versatility

Inactive Publication Date: 2017-03-08
GEER TECH CO LTD
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Problems solved by technology

[0006] In view of the problem that the parallelism cannot be quantified in the prior art, a method and system for judging the parallelism between the lens plane and the test chart plane of the present invention is proposed in order to solve or at least partially solve the above-mentioned problems

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  • Method and system for determining parallelism of lens plane and test chart plane
  • Method and system for determining parallelism of lens plane and test chart plane
  • Method and system for determining parallelism of lens plane and test chart plane

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Embodiment Construction

[0025] In view of the problem that the parallelism cannot be quantified in the prior art, a method and system for judging the parallelism between the lens plane and the test chart plane of the present invention is proposed. The design idea of ​​the present invention is: align the center of the lens to be tested with the center of the marked area on the test chart, assuming that the two planes are parallel, the center of the marked area will be located near the center of the picture, then analyze the center of the marked area in the picture The distance between the actual position and the theoretical position of the center of the picture is used to obtain the quantified value of the parallelism between the plane of the lens to be tested and the plane of the test chart, and then determine whether the two planes are parallel. In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be f...

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Abstract

The invention discloses a method and a system for determining parallelism of a lens plane and a test chart plane. The method comprises steps of: horizontally arranging a test chart, wherein a mark region is arranged on the test chart; arranging the center of a to-be-tested lens on a test tooling on a plumb line of the center of the mark region on the test chart, and aligning the center of the mark region; acquiring a picture, shot by the to-be-tested lens, of the test chart, and identifying the actual position of the center of the mark region on the picture; according to a formula, calculating the parallelism of the lens plane and the test chart plane; judging whether the parallelism is within a preset angle range; if yes, determining that the lens plane is parallel to the test chart plane; and if not, determining that the lens plane is not parallel to the test chart plane. According to the invention, the method and the system are suitable for all products including products with irregular appearances, and are highly universal; and parallelism can be judged according to a specific parallelism quantization value in a simple and reliable manner, subjective factors of persons are eliminated and precision is controllable.

Description

technical field [0001] The invention relates to the technical field of optical detection, in particular to a method and system for judging the parallelism between a lens plane and a test chart plane. Background technique [0002] Nowadays, many smart electronic products have camera functions. During the assembly and production process of the lenses with camera functions in these electronic products, performance testing is required, especially the optical characteristics of the lenses are tested to ensure the normality of product functions and keep them in good condition. user experience. The accuracy of the test results of the optical characteristics is based on the fact that the plane of the lens to be tested is relatively parallel to the plane of the test chart. The relative parallelism of the chart plane is an important factor affecting the accuracy of the test results. [0003] In the prior art, there are mainly two methods for judging parallelism: [0004] One is to ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/27
CPCG01B11/27
Inventor 胡志朋高新亮
Owner GEER TECH CO LTD
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