Scanning and integration verification comparison method for encrypted product

A product and comparison technology, applied in the direction of program loading/starting, cooperating devices, program control devices, etc., can solve problems such as programming errors, increased test workload, poor scalability, etc., to improve efficiency and meet large-scale requirements. Batch test requirements, the effect of shortening the test time

Inactive Publication Date: 2017-03-22
HUIZHOU BLUEWAY ELECTRONICS
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Problems solved by technology

During the test, the programming verification of BQ2022A series encrypted IC products, performance testing, and re-verification are subdivided into three stations for testing through the erection mode, which increases the difficulty of testing and requires a large investment in testing costs. Manpower and material resources, large limitations, poor scalability, high input costs, poor overall test stability, low operating efficiency, low quality and safety factor
At the same time, because the ID of the product is not the ID value in the product chip when the pr

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  • Scanning and integration verification comparison method for encrypted product

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Embodiment Construction

[0032] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0033] Please refer to figure 1 , a method for scanning and integrating verification comparisons of encrypted products, said method comprising:

[0034] S100: providing a main control module and a verification reading module in the hardware module;

[0035] S200: Add a communication module to the hardware module, and connect the communication module to the main control module;

[0036] S300: Use the performance test software to compare the fixed bytes burned, the serial ID number, and the manufacturing information date.

[0037] In one of the embodiments, the steps of comparing the programmed fi...

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Abstract

The present invention provides a scanning and integration verification comparison method for an encrypted product. The method is characterized by comprising: providing a main control module and a calibration reading module in a hardware module; adding a communication module in the hardware module, and connecting the communication module into the main control module; and comparing burning fixed bytes, sequence ID numbers and manufacturing information dates by means of performance test software. Our company realizes a burning verification performance test scheme for BQ2022A series encrypted IC products, which adopts a 20 channel parallel burning calibration-verification integrated test method and a 20 channel performance complex verification test method. The current device test scheme saves stations for complex verification, and integrates a function of complex verification into device performance tests.

Description

technical field [0001] The invention relates to the field of hardware, in particular to a method for scanning and integrating verification and comparison of encrypted products. Background technique [0002] In the production process of BQ2022A series encryption IC products, it is necessary to burn the program into the BQ2022A series encryption IC products, and then perform a verification test on the burning program to ensure that the burning program meets customer needs. At present, after the BQ2022A series of encryption IC products are burned, the enterprise needs to verify the product, and the performance test of the product is carried out only after the verification is passed. However, the existing BQ2022A series of encryption IC products in the industry are usually tested with the BQ2022A encryption IC. The supporting software and hardware provided. During the test, the programming verification of BQ2022A series encrypted IC products, performance testing, and re-verific...

Claims

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Application Information

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IPC IPC(8): G06F9/445G06K17/00G01R31/28
CPCG06F8/61G01R31/2851G06K17/0022
Inventor 邓振东曹志文陈思波黄建科
Owner HUIZHOU BLUEWAY ELECTRONICS
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