Scanning and integration verification comparison method for encrypted product

Abstract

The present invention provides a scanning and integration verification comparison method for an encrypted product. The method is characterized by comprising: providing a main control module and a calibration reading module in a hardware module; adding a communication module in the hardware module, and connecting the communication module into the main control module; and comparing burning fixed bytes, sequence ID numbers and manufacturing information dates by means of performance test software. Our company realizes a burning verification performance test scheme for BQ2022A series encrypted IC products, which adopts a 20 channel parallel burning calibration-verification integrated test method and a 20 channel performance complex verification test method. The current device test scheme saves stations for complex verification, and integrates a function of complex verification into device performance tests.

Description

technical field [0001] The invention relates to the field of hardware, in particular to a method for scanning and integrating verification and comparison of encrypted products. Background technique [0002] In the production process of BQ2022A series encryption IC products, it is necessary to burn the program into the BQ2022A series encryption IC products, and then perform a verification test on the burning program to ensure that the burning program meets customer needs. At present, after the BQ2022A series of encryption IC products are burned, the enterprise needs to verify the product, and the performance test of the product is carried out only after the verification is passed. However, the existing BQ2022A series of encryption IC products in the industry are usually tested with the BQ2022A encryption IC. The supporting software and hardware provided. During the test, the programming verification of BQ2022A series encrypted IC products, performance testing, and re-verific...

AI Technical Summary

Problems solved by technology

During the test, the programming verification of BQ2022A series encrypted IC products, performance testing, and re-verification are subdivided into three stations for testing through the erection mode, which increases the difficulty of testing and requires a large investment in testing costs. Manpower and material resources, large limitations, poor scalability, high input costs, poor overall test stability, low operating efficiency, low quality and safety factor

At the same time, because the ID of the product is not the ID value in the product chip when the product is being programmed, but the ID of the product itself, therefore, when the product obtains the serial ID of the original factory configuration, there is an error in obtaining the initial serial ID of the product. The output value is not the true value, which makes the ID value burned in the product wrong, resulting in a burning error. In addition, the verification and performance testing in the current product testing process are separated, so the workload of testing is increased. Reduced test efficiency and cannot meet the requirements of mass testing

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