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A probe test device for an electronic module

A technology for testing devices and electronic modules, which is applied in the directions of measuring devices, measuring device casings, components of electrical measuring instruments, etc., to meet production requirements, the device structure is simple, and the production capacity is increased.

Active Publication Date: 2019-05-14
NINGBO SUNNY OPOTECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] In order to solve the above-mentioned technical problems, the object of the present invention is to provide a probe testing device for electronic modules. operating problems

Method used

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  • A probe test device for an electronic module
  • A probe test device for an electronic module
  • A probe test device for an electronic module

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Embodiment Construction

[0028] The specific implementation manner of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0029] Such as figure 1 , figure 2 A probe test device for an electronic module shown, the probe test device includes a base 1, a test module and a fixture module, the test module and the fixture module are all arranged on the base 1, and the fixture module connects the electronic module Fixed testing in the test module. Such as figure 1 , Figure 7 As shown, the test module includes a test seat 2, a first circuit board 3 and a second circuit board 4, the test seat 2 is provided with a module fixing port 21, and the two sides of the module fixing port 21 are respectively provided with Mark points. And on the test socket 2, the first pin holder 22 is also fixed, the first pin holder 22 is provided with the first pin, the first pin connection is provided with a lower contact point, and the lower contact point is connected to ...

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PUM

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Abstract

The invention relates to a probe testing device of an electronic module, and belongs to the test field of electronic components. The probe testing device of the electronic module comprises a pedestal, a test module and a clamp module, both the test module and the clamp module are arranged on the pedestal, the clamp module fixes the electronic module to the test module for test, the test module comprises a test seat, a first circuit board and a second circuit board, and the clamp module comprises a push seat, a floating seat, upper and lower floating plates and a screw rod stepping motor. The testing device is simple in structure and convenient and safe in use, avoids repeated tedious manual work, improves the UPH of products, increases the production power, and avoids problems caused by manual operation. The yield rate of samples tested by the testing device is about 99.5%, and can satisfy production requirements completely.

Description

technical field [0001] The invention relates to the field of testing electronic components, in particular to a probe testing device for electronic modules. Background technique [0002] At present, during the manufacturing process of mobile phone camera modules, each product needs to be tested. During the test, it is necessary to transfer the interface of the product, that is, the Connector (male seat / female seat), to the product drive circuit board through the connector, so as to realize the test function of the product. [0003] With the continuous development and progress of science and technology, the demand for production line automation is also increasing, and Industry 4.0 is coming. In many production processes, it is not only necessary to be accurate, but also to continuously improve production efficiency. Manual work can no longer meet the production needs in terms of accuracy and efficiency improvement, so automatic probe test fixtures were born. [0004] The au...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04
CPCG01R1/0408
Inventor 王承雄毛狄青薛江亮黄文光邵登科崔嘉辉陈余天
Owner NINGBO SUNNY OPOTECH CO LTD
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