Test system of semiconductor laser chip
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- RESEARCH INSTITUTE OF TSINGHUA UNIVERSITY IN SHENZHEN
- Publication Date
- 2017-04-26
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
technical field
[0001] The invention relates to the technical field of testing semiconductor laser chips, in particular to a testing system for semiconductor laser chips. Background technique
[0002] With the rapid development of emerging fields such as laser display, laser lighting, 3D printing, and space-ground integrated network, the market for high-power semiconductor lasers is gradually expanding, and the high demand for high-power semiconductor lasers has brought about a huge demand for upstream semiconductor laser chips. , the requirements for output power and reliability of semiconductor laser chips are also increasing.
[0003] In order to test effectively, it is necessary to package the semiconductor laser chip on a heat sink with high thermal conductivity, referred to as the semiconductor laser chip component, which is convenient for the subsequent secondary integrated packaging design, such as optical fiber coupling. The common form of chip packaging is COS (Ch...