The invention discloses a method for measuring high reflectivity based on self-mixing effect of semiconductor laser which belongs to the technical field of measuring optical elements parameter. The present cavity ringdown technique for determining high reflectivity by measuring ringdown time, using the self-mixing effect of semiconductor laser, improves laser power to coupling efficiency of ringdown cavity by controlling back feedback optical intensity of continuous wave semiconductor laser, greatly improves the signal-noise ratio of cavity outputting signal, thereby improving measuring precision and measuring range of high reflectivity. The methods for controlling back feedback optical intensity which can make the cavity output signal reach the maximum include: inserting a linear polarizer, an attenuation plate, an optical isolator or a variable aperture between the semiconductor laser and the first cavity mirror, or adjusting the pitching of the first cavity mirror, or changing the distance of the laser and the first cavity mirror.