IC electrical characteristic test method capable of test and real-time feedback

A technology of electrical characteristics and real-time feedback, applied in the direction of measuring electricity, measuring electrical variables, and analog circuit testing, etc., can solve the problems of IC working voltage, power input anti-interference ability test, and real-time feedback of test status and test results. Achieve the effect of avoiding excessive voltage input and preventing improper operation

Active Publication Date: 2017-05-10
深圳市优克雷技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is that the existing technology cannot continuously test the IC operating voltage and power input anti-interferenc

Method used

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  • IC electrical characteristic test method capable of test and real-time feedback
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  • IC electrical characteristic test method capable of test and real-time feedback

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Embodiment 1

[0032] The present embodiment provides a kind of IC electrical characteristic testing device that can automatically test real-time feedback, such as figure 1 Said, including MCU controller, first low dropout linear regulator module LDO1, second low dropout linear regulator module LDO2, input protection circuit, LCD display module, button module, power gear circuit module, power interference circuit module, overcurrent protection circuit module, IC module to be tested.

[0033] The input protection circuit, the two low-dropout linear regulators connected to the input protection circuit are respectively the first low-dropout linear regulator LDO1 and the second low-dropout linear regulator LDO2, which are connected to the two low-dropout linear regulators. The MCU controller connected to the voltage regulator, the first low-dropout linear regulator LDO1 provides a stable working voltage for the MCU controller, the button module connected to the MCU controller, the LCD display mo...

Embodiment 2

[0046] On the basis of Example 1, this embodiment further illustrates the relationship between the number of gears in the power gear circuit and the number of GPIO ports of the MCU controller, and uses 4 GPIO ports of the MCU controller and a CD74HC4051 encoder to configure 16 different gears for the IC. Bits (S1~S16) voltage to realize the automatic test range of normal working voltage of IC. The test feedback information can be fed back to the MCU controller, and the MCU controller judges whether the current result is passed and displays it. It is also possible to monitor and display the current voltage of the IC through the ADC module that comes with the MCU controller. More gear voltages can be expanded through 4 PGIO ports, and the test results are more accurate.

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Abstract

The present invention discloses an IC electrical characteristic test method capable of test and real-time feedback, belonging to the electrical test device field. The test device comprises a MCU controller, a first low dropout regulator module (LDO1), a second low dropout regulator module (LDO2), an input protection circuit, a LCD display module, a button module, a power supply gear circuit module, a power supply interference circuit module, an over-current protection circuit module and an IC module to be tested. The test method comprises: setting a current threshold for the over-current monitoring, and cutting off the power supply when the current exceeds the current threshold; and setting a voltage threshold for the input protection circuit, and cutting off the power supply when the input voltage exceeds the voltage threshold. The problems are mainly solved that the continuous test cannot be performed and the real-time feedback cannot be realized in the prior art.

Description

technical field [0001] The invention relates to the field of electrical testing devices, in particular to an IC electrical characteristic testing method capable of automatic testing and real-time feedback. Background technique [0002] With the advancement of IC integrated circuit manufacturing technology, people have been able to manufacture integrated circuits with complex circuit structures, high integration, and various functions. However, these highly integrated and multi-functional integrated circuits are only connected to external circuits through a limited number of pins, which brings a lot of difficulties to determine the quality of integrated circuits. The test of analog circuit is generally divided into DC characteristic test and AC characteristic test. DC characteristic test mainly includes terminal voltage characteristic, terminal current characteristic and so on. DC parameter measurement measures IC electrical parameters in the form of voltage or current, the...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R31/316
CPCG01R31/2851G01R31/316
Inventor 不公告发明人
Owner 深圳市优克雷技术有限公司
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