Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

S parameter de-embedding method of multiport network

A multi-port network and de-embedding technology, applied in the field of testing, can solve problems such as complex calibration process, large difference in simulation parameters, and difficult testing, and achieve high precision, easy production, and simple calibration

Inactive Publication Date: 2017-05-31
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
View PDF8 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The first de-embedding method: use electromagnetic simulation to calculate the fixture parameters, but due to the actual processing and manufacturing of the fixture, there is a big difference from the simulation parameters, resulting in a big difference in the final test results
[0004] The second calibration method: making special calibration parts, but because of the difficulty in making customized calibration parts and the complicated calibration process, it is difficult to test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • S parameter de-embedding method of multiport network
  • S parameter de-embedding method of multiport network
  • S parameter de-embedding method of multiport network

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0052] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0053] With the development of electronic information technology, there are more and more multi-port devices, and the packaging forms and interface types of devices are also increasing. Using a network analyzer to test such devices needs to face the problem of multi-port fixture de-embedding.

[0054] The present invention proposes a method for de-embedding S parameters of a multi-port network. Firstly, the multi-port fixture parameters are obtained in a time d...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an S parameter de-embedding method of a multiport network. An S parameter of a multiport clamp is obtained, a matrix operation is used to remove the S parameter of the clamp after that the S parameter of the whole clamp is obtained, and a formula is derived in an incident / reflection wave manner during de-embedding. Compared with a present de-embedding method in which electromagnetic simulation is used to calculate the clamp parameter, the method of the invention is higher in precision; and compared with TRL calibration, calibration in the invention is simpler, and calibration pieces are easier to prepare.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to an S-parameter de-embedding method of a multi-port network. Background technique [0002] Nowadays, there are more and more multi-port devices and connectors, and the demand for testing is also increasing. In the face of various devices and connectors, special fixtures need to be made to connect to the ports of the vector network instrument. To remove the influence of the fixture in the test, two solutions are needed, the first is de-embedding, and the second is calibration. [0003] The first method of de-embedding: use electromagnetic simulation to calculate the fixture parameters, but due to the actual processing and manufacturing of the fixture, there is a big difference from the simulation parameters, resulting in a big difference in the final test results. [0004] The second calibration method: make special calibration parts, but because of the difficulty of making custo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 李立功庄志远袁国平郭永瑞李树彪刘丹李明太赵立军蔡洪坤
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com