Method of rapidly increasing chip verification random regression coverage rate based on linear learning
A coverage and linear technology, which is applied in the field of rapidly improving the random regression coverage of chip verification based on linear learning, can solve the problems of increased workload, repetition, and time-consuming, so as to improve analysis and increase and shorten the time spent Effect
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[0024] In view of the deficiencies in the prior art, the inventor of this case was able to propose the technical solution of the present invention after long-term research and extensive practice. The technical solution, its implementation process and principle will be further explained as follows.
[0025] The embodiment of the present invention provides a method for quickly improving code coverage, which specifically includes:
[0026] a. Analyze the logic code related to the function point to be covered, and obtain the incentive combination that can cover the function point;
[0027] Scripts can be used to analyze and parse the statements of different logical operators in the code to be covered, and obtain the incentive combination that can reach the code that needs to be covered;
[0028] b. Establish the corresponding logical tree according to the logical operators;
[0029] Establish a corresponding tree structure according to the logical operators in the code to be cov...
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