A threshold parameter test method for high-power three-phase bridge driver
A three-phase bridge type and parameter testing technology, which is applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problem of inaccurate threshold value and other problems
Active Publication Date: 2020-02-07
CASIC DEFENSE TECH RES & TEST CENT
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Problems solved by technology
[0003] There is no effective solution to the problem that the threshold value obtained by the test method in the prior art is not accurate enough when testing the high-power three-phase bridge driver
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[0031] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be further clearly, completely and detailedly described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments of the present invention belong to the protection scope of the present invention.
[0032] According to an embodiment of the present invention, a threshold parameter testing method of a high-power three-phase bridge driver is provided.
[0033] like figure 1 As shown, the threshold parameter testing method of the high-power three-phase bridge driver provided according to the embodiment of the present invention includes:
[0034] Step S101, accord...
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The invention discloses a high-power three-phase bridge type driver threshold parameter testing method. The method comprises the steps that tested pins on a high-power three-phase bridge type driver and enabling monitoring pins on a testing device and current and voltage sources of the pins are selected according to threshold parameters to be tested; slope voltage signals are generated according to the working voltage range of the tested pins and led into the current and voltage sources of the tested pins; clock frequency signals are generated, and the clock frequency is provided; voltage and current signals output by the enabling monitoring pins are collected, clock cycles are obtained, and threshold levels are obtained; whether the threshold levels meet the precision requirement or not is judged, if yes, the threshold levels serve as the threshold parameters to be output, and if not, collecting and testing are conducted again by adjusting the voltage range of the slope voltage signals and the frequency of the clock frequency.
Description
technical field [0001] The invention relates to the field of circuit detection, in particular to a threshold parameter testing method of a high-power three-phase bridge driver. Background technique [0002] Threshold parameter is a very important parameter of integrated circuits. It is very common in both analog devices and digital devices. For example, the enable terminal, chip select terminal, and state control terminal of the device often need to test its threshold. The general threshold test method is the limit value test method, which is the so-called test method. According to the values of the upper and lower limits of the threshold parameters to be tested given in the data sheet of the device, ATE is used to apply corresponding values to the pins to be tested. Then determine the working state of the device by testing the corresponding pins (state monitoring pins) of the device, thereby qualitatively judging whether the device is qualified. However, when testing h...
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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 陈波郑玉玲梁宇飞赵帅闫兴亮
Owner CASIC DEFENSE TECH RES & TEST CENT