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High-power three-phase bridge type driver threshold parameter testing method

A three-phase bridge type, parametric testing technology, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve the problem of inaccurate thresholds and other issues

Active Publication Date: 2017-06-13
CASIC DEFENSE TECH RES & TEST CENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] There is no effective solution to the problem that the threshold value obtained by the test method in the prior art is not accurate enough when testing the high-power three-phase bridge driver

Method used

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  • High-power three-phase bridge type driver threshold parameter testing method
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Embodiment Construction

[0031] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following will further describe the technical solutions in the embodiments of the present invention clearly, completely and in detail with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art fall within the protection scope of the present invention.

[0032] According to an embodiment of the present invention, a threshold parameter test method of a high-power three-phase bridge driver is provided.

[0033] Such as figure 1 As shown, the threshold parameter test method of the high-power three-phase bridge driver provided according to the embodiment of the present invention includes:

[00...

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Abstract

The invention discloses a high-power three-phase bridge type driver threshold parameter testing method. The method comprises the steps that tested pins on a high-power three-phase bridge type driver and enabling monitoring pins on a testing device and current and voltage sources of the pins are selected according to threshold parameters to be tested; slope voltage signals are generated according to the working voltage range of the tested pins and led into the current and voltage sources of the tested pins; clock frequency signals are generated, and the clock frequency is provided; voltage and current signals output by the enabling monitoring pins are collected, clock cycles are obtained, and threshold levels are obtained; whether the threshold levels meet the precision requirement or not is judged, if yes, the threshold levels serve as the threshold parameters to be output, and if not, collecting and testing are conducted again by adjusting the voltage range of the slope voltage signals and the frequency of the clock frequency.

Description

Technical field [0001] The invention relates to the field of circuit detection, in particular to a threshold parameter test method of a high-power three-phase bridge driver. Background technique [0002] Threshold parameters are a very important parameter of integrated circuits. Both analog and digital devices are common. For example, the enable terminal, chip select terminal, and status control terminal of the device often need to be tested for their thresholds. The general threshold test method is the limit value test method, which is the so-called trial test method. According to the upper and lower limit values ​​of the threshold parameter to be tested given in the data sheet of the device, use ATE to apply the corresponding value to the tested pin. Then determine the working status of the device by testing the corresponding pins (state monitoring pins) of the device, thereby qualitatively judging whether the device is qualified. However, when testing high-power three-phase b...

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 陈波郑玉玲梁宇飞赵帅闫兴亮
Owner CASIC DEFENSE TECH RES & TEST CENT