Automatic test method and device of full functional coverage of embedded control chip

Abstract

The present invention discloses an automatic test method and device of the full functional coverage of an embedded control chip. The method includes the following steps that: a serial port automation tool is connected with a master control chip through the embedded control chip; the serial port automation tool is utilized to automatically operate the command line of the master control chip so as to read data from the register of the embedded control chip; the read data are compared with preset data in scripts; and when the read data are identical with the preset data, it is judged that the register passes a test. The device comprises a serial port automation tool which is connected with a master control chip through the embedded control chip; the serial port automation tool is utilized to automatically operate the command line of the master control chip, read data from the register of the embedded control chip and compare the read data are with preset data in scripts; and the serial port automation tool judges that the register passes a test when the read data are identical with the preset data. With the method and device adopted, test efficiency can be improved, requirements for relevant test staff can be reduced, and wrong detection and missed detection can be avoided.

Description

technical field [0001] The invention belongs to the technical field of chip testing, and in particular relates to an automatic testing method and device for full-function coverage of an embedded control chip. Background technique [0002] The reliability of the underlying software system of a single board is an important basis for the reliability of the whole machine. Especially in the storage field, reliability is the life of the storage system, so the reliability of the underlying software system of a single board is particularly important. The full-function coverage test of the embedded control chip is a very effective method for the reliability test of the underlying software system of the single board, but the registers of the embedded control chip are complicated and the regularity is small, which is time-consuming and laborious in the manual inspection process. Specifically, in the writing of the underlying software of the embedded control chip, many registers, especi...

AI Technical Summary

Problems solved by technology

The full-function coverage test of the embedded control chip is a very effective method for the reliability test of the underlying software system of the single board, but the registers of the embedded control chip are complicated and the regularity is small, and it is time-consuming and laborious to manually check.

Specifically, in the writing of the underlying software of the embedded control chip, it takes a lot of time to check many registers, especially many status registers, and it is easy to make mistakes and miss checks.

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