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A Scanning Laue Diffraction Spectrum Analysis Method Based on Peak-to-Peak Angle Comparison

An analysis method and scanning technology, applied in the direction of using wave/particle radiation for material analysis, analysis of materials, instruments, etc., can solve problems such as limited application, and achieve the effect of less computer resource consumption, short time consumption, and small amount of calculation.

Active Publication Date: 2019-10-15
XI AN JIAOTONG UNIV
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  • Abstract
  • Description
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Problems solved by technology

However, this disadvantage severely limits the application of the technology

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  • A Scanning Laue Diffraction Spectrum Analysis Method Based on Peak-to-Peak Angle Comparison
  • A Scanning Laue Diffraction Spectrum Analysis Method Based on Peak-to-Peak Angle Comparison
  • A Scanning Laue Diffraction Spectrum Analysis Method Based on Peak-to-Peak Angle Comparison

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Embodiment Construction

[0053] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and understandable, the following combination figure 2 The illustrated embodiment samples describe in detail the specific implementation method of the present invention.

[0054] figure 2 The example sample shown is 304 stainless steel, in figure 2 The crystal orientation information of each point in the sample can be seen in , and the distribution of grain boundaries can be clearly seen.

[0055] Such as figure 1 As shown, the scanning Laue diffraction pattern analysis method based on the angle between peaks in this embodiment includes the following steps:

[0056] Step 1: Using a known method, perform a peak-finding operation on all the Laue diffraction patterns obtained from the scanning Laue diffraction experiment, and obtain the positions and integral intensities of all diffraction peaks on each Laue diffraction pattern.

[0057] Step 2: Calculate the...

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Abstract

The invention discloses a scanning Laue diffraction spectrum analysis method based on peak-to-peak included angle comparison. The analysis method includes the steps of: 1) performing peak searching operation to all obtained diffraction spectrums in experiment to acquire position and integral intensity of a diffraction peak; 2) defining a method for calculating standard peak angle differential sequence D<S, i> of an indexation point; 3) defining a method of comparing whether two points belong to the same crystalline grain or not; 4) selecting a traversal method to traverse all points in an experimental zone, thus completing the calibration of peaks of the diffraction spectrums corresponding to all points in the experimental zone and acquiring crystal / phase boundary distribution in the experimental zone. The method has low calculation load and is short in time consumption.

Description

technical field [0001] The present invention relates to the technical field of characterization methods for crystal microstructures, in particular to an analysis of scanning Laue diffraction patterns, in which the diffraction peaks in the scanning Laue diffraction patterns are calibrated and at the same time the crystals / crystals in the scanning area of ​​scanning Laue diffraction experiments are obtained. Method for Phase Boundary Segmentation Information. Background technique [0002] The microstructure of materials has a significant impact on the mechanical properties of materials, thus affecting the service use of materials. Therefore, it is of great significance to characterize the microstructure of materials to study the mechanical behavior and failure mechanism of materials, so as to improve the material processing technology of related materials. The commonly used characterization methods for the microstructure of materials include optical microscope, scanning elect...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/207
Inventor 陈凯寇嘉伟朱文欣
Owner XI AN JIAOTONG UNIV
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