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Investigation apparatus and investigation method

A technology of equipment and questionnaires, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve the problems of time spent (increased survey time, etc.)

Active Publication Date: 2017-07-21
FUJITSU LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, in the case of performing post-investigation on table data leaks, the time taken for processing (investigation time) by extraction of feature data or determination of similarity increases compared with usual files

Method used

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  • Investigation apparatus and investigation method
  • Investigation apparatus and investigation method
  • Investigation apparatus and investigation method

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Embodiment Construction

[0038] Preferred embodiments of the present invention will be described with reference to the accompanying drawings. In various embodiments, components having the same function are denoted by the same reference numerals, and redundant descriptions thereof are omitted. In addition, the survey device, survey program, and survey method described in the following embodiments are exemplary, and they do not limit the embodiments. In addition, the following embodiments may be properly combined in the absence of contradiction.

[0039] figure 1 is a block diagram showing the functional configuration of the investigation device 1 according to the embodiment. figure 1 The illustrated investigation device 1 is, for example, an information processing device such as a PC (Personal Computer). The investigation device 1 receives the table data D1 based on the original questionnaire and the table data D2 based on the target questionnaire, and investigates the degree of similarity between...

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Abstract

The invention provides an investigation apparatus and investigation method. An investigation apparatus according to an embodiment includes a processor that executes a process including: analyzing uniqueness of a plurality of values included in an attribute for each attribute of a table; reducing a plurality of values included in an attribute of which the analyzed uniqueness is lower than a predetermined value by a predetermined ratio with respect to an investigation original table and outputting a feature of the investigation original table; reducing a plurality of values included in an attribute of which the analyzed uniqueness is higher than a predetermined value by a predetermined ratio with respect to an investigation target table and outputting a feature of the investigation target table; and investigating similarity of the investigation target table to the investigation original table by comparing the feature of the investigation original table with the feature of the investigation target table.

Description

technical field [0001] Embodiments discussed herein relate to survey devices and survey methods. Background technique [0002] In the prior art, in companies and the like, as one of measures against information leakage, post-investigation for identifying the source of information leakage is performed. In subsequent investigations for information leaks, characteristics (fingerprints (hereinafter, referred to as characteristic data)) of operated files are recorded together with operation logs when operations on files such as file browsing or file saving are performed. Therefore, in the investigation of information leakage, the source of information leakage is identified by referring to the recorded feature data to identify the operation log of a file similar to the information leaked. [0003] Patent Document 1: Japanese Laid-Open Patent Publication No. 2005-4560. [0004] However, in the related art described above, in the survey of table data describing information of vari...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F21/62G06F17/30
CPCG06F16/2282G06F21/6227H04L63/302G06F7/02G06F21/577G06F2221/034
Inventor 小樱文彦伊藤孝一
Owner FUJITSU LTD