Method and device for measuring infrared reflectivity of target object
A technology of infrared reflection and target objects, applied in the measurement of scattering characteristics, etc., can solve the problems of high price, complicated measurement process, poor applicability, etc.
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[0050] In order to enable those skilled in the art to better understand the technical solutions in the embodiments of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0051] see figure 1 As shown, it is an implementation flowchart of a method for measuring infrared reflectivity of a target object provided by an embodiment of the present invention. The method is applied to an infrared reflectivity measurement camera and may include the following steps:
[0052] S101. E...
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