Method and device for measuring infrared reflectivity of target object

A technology of infrared reflection and target objects, applied in the measurement of scattering characteristics, etc., can solve the problems of high price, complicated measurement process, poor applicability, etc.

Active Publication Date: 2017-08-01
HANGZHOU HIKVISION DIGITAL TECH
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

Absolute measurement method, for example, can measure the infrared reflectivity of an object through precision instruments such as integrating spheres, but such measuring equipment is complex in structure and expensive, and has poor applicability
The relative measurement method can obt

Method used

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  • Method and device for measuring infrared reflectivity of target object
  • Method and device for measuring infrared reflectivity of target object
  • Method and device for measuring infrared reflectivity of target object

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Embodiment Construction

[0050] In order to enable those skilled in the art to better understand the technical solutions in the embodiments of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0051] see figure 1 As shown, it is an implementation flowchart of a method for measuring infrared reflectivity of a target object provided by an embodiment of the present invention. The method is applied to an infrared reflectivity measurement camera and may include the following steps:

[0052] S101. E...

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Abstract

The embodiment of the invention discloses a method and a device for measuring infrared reflectivity of a target object, which are applied to an infrared reflectivity measurement camera. The method comprises the following steps: emitting infrared light to the target object to be measured; reflecting reflected light reflected by the target object, and obtaining position information of the target object and the infrared reflectivity measurement camera according to the received reflected light reflected by the target object; according to the position information of the target object and the infrared reflectivity measurement camera and position information, obtained in advance, of a reference object and the infrared reflectivity measurement camera, performing normalization processing on first reflected light energy of the received reflected light, thus obtaining second reflected light energy; based on the second reflected light energy, and third reflected light energy and infrared reflectivity of the reference object, which are obtained in advance, determining the infrared reflectivity of the target object. According to the embodiment, the infrared reflectivity of the target object can be simply and conveniently measured.

Description

technical field [0001] The invention relates to the technical field of video surveillance, in particular to a method and device for measuring infrared reflectivity of a target object. Background technique [0002] In scenarios such as video surveillance, it may be necessary to identify the material of the target object in the video image. A common method is to identify the object material through the infrared reflectance of the object. [0003] The information of object characteristics can be reflected in the spectral characteristics of the object, such as the judgment of vegetation state and the analysis of chemical composition by using spectral characteristics. Infrared light spectrum measurement belongs to the measurement of spectral characteristics of specific wavelengths. The ability of an object to reflect infrared light is called infrared reflectance, which can reflect certain characteristics of the object. [0004] There are two main methods for measuring the infra...

Claims

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Application Information

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IPC IPC(8): G01N21/55
CPCG01N21/55
Inventor 覃骋毛慧俞海沈林杰浦世亮
Owner HANGZHOU HIKVISION DIGITAL TECH
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