Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Single-pixel detector spectral reflectivity reconstruction method based on sparse prior

A technology of spectral reflectance and sparse prior, which is applied in the field of spectral reflectance reconstruction of single-pixel detectors based on sparse prior, can solve the problems of high requirements and complexity of optical equipment, and achieves improved reconstruction accuracy, reduced sampling number, The effect of reducing optical complexity

Inactive Publication Date: 2017-08-22
UNIV OF SHANGHAI FOR SCI & TECH
View PDF4 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention is aimed at the problem of high and complicated optical equipment for acquiring multispectral images, and proposes a single-pixel detector spectral reflectance reconstruction method based on sparse prior, which can reduce the optical complexity of the multispectral data acquisition system , reduce the number of samples, improve the spectral reconstruction efficiency of reflectivity, and improve the reconstruction accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Single-pixel detector spectral reflectivity reconstruction method based on sparse prior
  • Single-pixel detector spectral reflectivity reconstruction method based on sparse prior
  • Single-pixel detector spectral reflectivity reconstruction method based on sparse prior

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The steps of the reconstruction method of spectral reflectance of single-pixel detector based on sparse prior are as follows:

[0028] 1) Processing of the training sample set: figure 1 It is a schematic diagram of spectral reflectance reconstruction based on a single-pixel detector. For the acquisition of the spectral reflectance of an area array object, a CCD array is used to collect the energy value of the modulated spectral reflectance of the object (each pixel of the CCD is used as a single-pixel detector Measure the light energy value of the corresponding position of the object), and then obtain the multi-spectral reflectance of the area array object. And use the following formula (1) to conduct principal component analysis on the obtained reflectance spectrum, so as to obtain J basis function vectors of the training sample set, and take the first three basis function vectors [b1, b2, b3] according to the contribution rate As the reconstruction basis function vec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for reconstructing the spectral reflectance of a single-pixel detector based on sparse priors, which performs principal component analysis on the training sample set, and obtains the first three principal components of the spectral reflectance data of the training sample set as the reconstruction basis function Vector; through the single-pixel detector to collect the spectral energy of a single multi-spectral test color block, the energy value U is obtained; in the process of solving the training sample set, the basis function vector B, the basis function vector coefficient a and the specific coefficient of the measurement matrix are obtained The reflectance of the test sample is reconstructed by the obtained spectral energy U collection for a single multi-spectral test color patch. The present invention can make full use of the spatially sparse feature of spectral reflectance and the sparse prior knowledge of the relative spectral power distribution of the lighting source based on the principal component orthogonal basis, reduce the optical complexity of the multi-spectral data acquisition system, reduce the number of samples, and improve the spectrum of the reflectance Improve reconstruction efficiency and improve reconstruction accuracy.

Description

technical field [0001] The invention relates to an image processing technology, in particular to a method for reconstructing spectral reflectance of a single-pixel detector based on sparse prior. Background technique [0002] The spectral reflectance reconstruction method uses the obtained multispectral image to obtain spectral reflectance information that is independent of equipment and scene by using methods such as pseudo-inverse reconstruction, Wiener reconstruction, and finite-dimensional reconstruction. At present, equipment for obtaining multispectral images generally uses grating light splitting, mechanical rotating filters, liquid crystal tunable filters and nanohole arrays for light splitting. The first two methods above have high optical system complexity and poor reliability, while the latter two methods The price is expensive and the production process is complicated. Contents of the invention [0003] The present invention is aimed at the problem of high and...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28
CPCG01J3/2823G01J2003/2826
Inventor 张雷洪李贝康祎占文杰易文娟陈智闻耿润
Owner UNIV OF SHANGHAI FOR SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products