Analog signal sampling method and sampling device

Abstract

The invention discloses an analog signal sampling method. The method comprises steps as follows: responding sampling requests for high-frequency analog signals and low-frequency analog signals, and starting a high-frequency timer and a low-frequency timer for timed work, wherein the high-frequency timer starts timing from a first timing initial value, resets at the low-frequency timing cycle and starts timing from zero again; the low-frequency timer starts timing from a second timing initial value, resets at the low-frequency timing cycle and starts timing from zero again; the low-frequency timing cycle is an integral multiple of the high-frequency timing cycle, and the difference between the first timing initial value and the second timing initial value is larger than zero and is not in a multiple relation with the high-frequency timing cycle; a sampling module is triggered to sample analog signals when the timing value is detected to be zero. Correspondingly, the invention further discloses an analog signal sampling device. With the adoption of the embodiment, the sampling accuracy of the analog signals is improved, and the condition that high-frequency sampling is affected by low-frequency sampling is avoided.

Description

technical field [0001] The present invention relates to the technical field of analog signal sampling, and in particular, to a sampling method and a sampling device of an analog signal. Background technique [0002] In an analog signal circuit, it is often necessary to perform analog signal acquisition on the components on the circuit, also known as AD acquisition. For circuits with multiple AD acquisitions, there are high-frequency signal acquisitions of tens of kHz, low-frequency signal acquisitions of a few kHz, and even temperature acquisitions with slower acquisition frequencies. High-frequency signal acquisition cannot be interfered, even if it is a few hundred nanoseconds of interference, it will cause a large acquisition error. In the prior art, high-frequency signal acquisition, low-frequency signal acquisition, and temperature acquisition are collected according to their acquisition cycles. , it will also cause some sampled signals on the control to have spikes. ...

AI Technical Summary

Problems solved by technology

For circuits with multiple AD acquisitions, there are high-frequency signal acquisitions of tens of kHz, low-frequency signal acquisitions of a few kHz, and even temperature acquisitions with slower acquisition frequencies.

It cannot be disturbed during high-frequency signal acquisition, even if it is a few hundred nanoseconds of interference, it will cause a large acquisition error

In the prior art, the high-frequency signal collection, low-frequency signal collection and temperature collection are collected according to their respective collection periods, but in some cases, the low-frequency signal collection and temperature collection will affect the high-frequency signal collection, which will not only make the collection deviate , will also cause spikes in some sampled signals on the control

Images