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Sensor optimized deployment method based on fault increasing trend correlation analysis

A sensor and correlation technology, applied in the direction of instruments, electrical testing/monitoring, control/regulation systems, etc., can solve problems such as failure to effectively describe the growth trend of faults, and achieve the effect of reducing monitoring costs and improving efficiency and accuracy

Active Publication Date: 2017-10-03
谭晓栋
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the defect that the existing sensor selection method cannot effectively describe the fault growth trend, the present invention provides a sensor optimization deployment method based on the correlation analysis of the fault growth trend

Method used

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  • Sensor optimized deployment method based on fault increasing trend correlation analysis
  • Sensor optimized deployment method based on fault increasing trend correlation analysis
  • Sensor optimized deployment method based on fault increasing trend correlation analysis

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Embodiment 1

[0031] Such as Figure 1-3 As shown, a sensor optimization deployment method based on the correlation analysis of the failure growth trend includes the following steps:

[0032] S1. Initial deployment of sensor set S i ={S 1 , S 2 , S 3 ,..., S M }, M is the total number of sensors, and all sensors in the sensor set are used to collect data on the failure growth process.

[0033] S2. Perform feature extraction on the data collected by each sensor, and then use the traditional damage index (root mean square, kurtosis index, impulse index, peak index or margin index) to establish the failure growth trend described by each sensor

[0034] S3. Use function fitting methods (polynomial function, exponential function, double exponential function or Gaussian function) to describe the failure growth trend of all sensors Perform fitting to obtain the fault growth trend after fitting Φ 0 .

[0035] S4, calculate the i-th sensor S i Described failure growth trend And the fault growth trend afte...

Embodiment 2

[0038] A sensor optimization deployment method based on correlation analysis of failure growth trend. The difference from Embodiment 1 is that this embodiment discloses the i-th sensor S i Described failure growth trend And the fault growth trend after fitting Φ 0 The correlation calculation formula is:

[0039]

[0040] Where for And Φ 0 The correlation degree, Φ Si (n) is the sensor S i Described true failure growth trend, Φ 0 (n) is the fault growth trend after fitting, N is the number of discrete sampling points in the fault growth process, k is the delay amount, N 0 Is the maximum amount of delay.

Embodiment 3

[0042] A method for optimal deployment of sensors based on analysis of the correlation of failure growth trends. Different from Embodiment 1, this embodiment discloses that the sensor set S is initially deployed i ={S 1 , S 2 , S 3 ,..., S M }, select the described fault growth trend and the fitted fault growth trend Φ 0 The most relevant sensors are deployed, and the remaining sensors are used as redundant sensors to remove specific implementation methods.

[0043] According to formula (2), the fault growth trend after selection and fitting Φ 0 The sensor with the highest correlation is the optimal sensor to monitor the failure growth process, that is, the optimally deployed sensor

[0044]

[0045] Where Is the i-th sensor S i Described failure growth trend And the fault growth trend after fitting Φ 0 Relevance, for The maximum value in It is the sensor with the greatest correlation.

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Abstract

The invention discloses a sensor optimized deployment method based on fault increasing trend correlation analysis. The sensor optimized deployment method comprises the steps of: S1, forming a preliminary deployment sensor set, and acquiring data in the fault increasing process by using all sensors in the sensor set; S2, establishing a fault increasing trend described by each sensor through utilizing traditional damage indexes; S3, fitting the fault increasing trends described by all the sensors by adopting a function fitting method, so as to obtain a fault increasing trend after fitting; S4, calculating correlation between the fault increasing trends described by i sensors and the fault increasing trend after fitting, and drawing a correlation curve; S5, and selecting the sensor with the maximum correlation between the described fault increasing trend and the fault increasing trend after fitting for deployment in the preliminary deployment sensor set. The sensor optimized deployment method is used for deploying the sensor having high sensitivity and stability to the fault increasing trend for a system, can effectively reduce the monitoring cost, and realize precise monitoring on the fault increasing process.

Description

Technical field [0001] The invention relates to a sensor optimized deployment technology, in particular to a sensor optimized deployment method based on the analysis of the correlation of the failure growth trend. Background technique [0002] Currently, well-known sensor optimization deployment methods are mainly developed around how to improve fault detection and isolation capabilities, and mainly include model-based and data-based methods. The model-based method mainly establishes the relationship between the fault source and different monitoring parameters through Kalman filtering, and guides the deployment of sensors with the goal of maximizing fault diagnosis capabilities. The data-based method mainly relies on signal processing, and the early fault detection ability by processing the signal collected by the sensor is used as the selection criterion. The use of data-based sensor deployment methods mainly focuses on two aspects: one is to extract fault features that are dif...

Claims

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Application Information

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IPC IPC(8): G05B23/02
CPCG05B23/0243G05B2219/24065
Inventor 谭晓栋
Owner 谭晓栋
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