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Temperature step-down aging test method and device for LED lamp

A technology for LED lamps and aging tests, applied in the field of LED lighting, can solve the problems of fast stepping aging life of LED lamps and stepping temperature design, aging, etc., and achieve the effect of achieving high reliability modeling and solving temperature design.

Inactive Publication Date: 2017-10-20
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

But at present, it is based on the aging of multiple temperature stresses realized by the LED module, and has not solved the problem of fast and step-by-step temperature design in the step-by-step aging life prediction of LED lamps

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  • Temperature step-down aging test method and device for LED lamp
  • Temperature step-down aging test method and device for LED lamp
  • Temperature step-down aging test method and device for LED lamp

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Embodiment Construction

[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0023] refer to figure 1 Shown is a kind of LED lamp temperature step-down aging test method provided by the present invention. The temperature step-down aging test method of the LED lamp includes:

[0024] S1, obtain the accelerated life of the LED lamp;

[0025] S2, using a two-stage method to realize the reliability analysis of LED lamps;

[0026] S3, selecting samples for experimental design;

[0027] S4, calculating the normal temperature lifetime of the sample.

[0028] The step S2, using a two-stage method to realize the reliability analysis of LED lamps, specifically inclu...

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Abstract

The invention discloses a temperature step-down aging test method for an LED lamp. The method comprises the steps: obtaining the accelerated life of the LED lamp; achieving the reliability of the LED lamp through a two-stage method; selecting a sample for an experiment design; and calculating the normal-temperature service life of the sample. The invention also provides a temperature step-down aging test device for the LED lamp. The method and device provided by the invention can quickly achieve the prediction of the service life of the LED lamp.

Description

technical field [0001] The invention relates to the field of LED lighting, in particular to a method and device for an LED lamp temperature step-down aging test. Background technique [0002] As the fourth generation of new energy, LED is widely used in various lighting fields due to its long life, high efficiency and energy saving. Although people have generally accepted and recognized the views on its energy saving and environmental protection, its long life and reliability have not been widely recognized. At present, most of the test methods of the whole lamp refer to IESLM-79, and the test time is recommended to be at least 6000 hours. Therefore, how to quickly and accurately realize the life prediction and reliability analysis of LED lighting products has always been a hot research topic in various circles. [0003] A way to quickly realize the reliability life prediction of LED lamps is to conduct accelerated aging tests, such as constant stress accelerated aging and ...

Claims

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Application Information

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IPC IPC(8): G01R31/44
CPCG01R31/44
Inventor 荆雷客洪亮王尧王潇洵高群孙强
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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