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High-temperature aging test instrument and constant-temperature control method thereof

A high-temperature aging and tester technology, which is applied in the direction of temperature control using electric methods, auxiliary controllers with auxiliary heating devices, instruments, etc., can solve the problem of large errors, large temperature drift, and the inability to collect and analyze the operation of the tested product parameters and other issues to achieve the effect of setting a wide range of temperature and reducing temperature drift and error

Inactive Publication Date: 2012-02-22
SHENZHEN NETCOM ELECTRONICS CO LTD
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Problems solved by technology

[0004] The purpose of the present invention is to provide a high-temperature aging tester, which aims to solve the problems of large temperature drift and large error in the current high-temperature aging tester, and the current high-temperature aging tester cannot collect and analyze the tested product during the high-temperature test. The problem with the operating parameters under

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  • High-temperature aging test instrument and constant-temperature control method thereof
  • High-temperature aging test instrument and constant-temperature control method thereof
  • High-temperature aging test instrument and constant-temperature control method thereof

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Embodiment Construction

[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0023] figure 1 The structure of the high-temperature aging tester provided by the first embodiment of the present invention is shown. For the convenience of description, only the parts related to the embodiment of the present invention are shown, and the details are as follows.

[0024] The high-temperature aging tester 1 includes a metal box 101, and the metal box 101 is provided with a test power-on interface 102 for powering the tested product; the high-temperature aging tester 1 also includes a test module 103 for collecting and analyzing the operating parameters of the tested product. In the...

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Abstract

The invention relates to the field of electronic test, in particular to a high-temperature aging test instrument and a constant-temperature control method thereof. In the embodiment of the invention, a temperature control module of the high-temperature aging test instrument controls the heating condition of a heater through judging whether the environment temperature of a metal box conforms to the target temperature or not, so the environment temperature of the metal box is synchronous with the target temperature, the temperature drift and the error are reduced, and in addition, the set temperature has a wide range and can be continuously regulated. In addition, the high-temperature aging test instrument is provided with a test electrification interface, so the high-temperature aging test instrument can collect and analyze the operation parameters of tested products at high temperature, and testers can more perfectly know the operation condition of the tested products in the high-temperature test.

Description

technical field [0001] The invention belongs to the field of electronic testing, and in particular relates to a high-temperature aging tester and a constant temperature control method thereof. Background technique [0002] The aging test is a process of simulating various factors involved in the actual use conditions of the product to carry out corresponding condition strengthening experiments on the aging of the product. Through the aging test, we can understand the aging of the product when it is used under specific conditions, and pass the aging test. High-quality products can ensure their reliability and life cycle, which is of great help to improve the quality of products. The aging tester is one of the commonly used equipment in various aging tests, and is widely used in the testing of electronics, computers, communications and other products. [0003] There are many kinds of high-temperature aging testers in the current aging test equipment. The high-temperature agin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G05D23/30
Inventor 何宏李志雄庞卫文
Owner SHENZHEN NETCOM ELECTRONICS CO LTD
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