High-temperature aging test instrument and constant-temperature control method thereof

Abstract

The invention relates to the field of electronic test, in particular to a high-temperature aging test instrument and a constant-temperature control method thereof. In the embodiment of the invention, a temperature control module of the high-temperature aging test instrument controls the heating condition of a heater through judging whether the environment temperature of a metal box conforms to the target temperature or not, so the environment temperature of the metal box is synchronous with the target temperature, the temperature drift and the error are reduced, and in addition, the set temperature has a wide range and can be continuously regulated. In addition, the high-temperature aging test instrument is provided with a test electrification interface, so the high-temperature aging test instrument can collect and analyze the operation parameters of tested products at high temperature, and testers can more perfectly know the operation condition of the tested products in the high-temperature test.

Description

technical field [0001] The invention belongs to the field of electronic testing, and in particular relates to a high-temperature aging tester and a constant temperature control method thereof. Background technique [0002] The aging test is a process of simulating various factors involved in the actual use conditions of the product to carry out corresponding condition strengthening experiments on the aging of the product. Through the aging test, we can understand the aging of the product when it is used under specific conditions, and pass the aging test. High-quality products can ensure their reliability and life cycle, which is of great help to improve the quality of products. The aging tester is one of the commonly used equipment in various aging tests, and is widely used in the testing of electronics, computers, communications and other products. [0003] There are many kinds of high-temperature aging testers in the current aging test equipment. The high-temperature agin...

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Problems solved by technology

[0004] The purpose of the present invention is to provide a high-temperature aging tester, which aims to solve the problems of large temperature drift and large error in the current high-temperature aging tester, and the current high-temperature aging tester cannot collect and analyze the tested product during the high-temperature test. The problem with the operating parameters under

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