Check patentability & draft patents in minutes with Patsnap Eureka AI!

Method and system for predicting crop yield

A forecasting method and crop technology, applied in forecasting, data processing applications, instruments, etc., can solve problems such as low accuracy of crop yield forecasting, and achieve the effect of reasonable index judgment and improved accuracy.

Active Publication Date: 2020-04-03
AGRI INFORMATION INST OF CAS
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The object of the present invention is to provide a method and system for predicting crop yields, which can select the optimal trend per unit yield model, thereby solving the problem of low accuracy in crop yield forecasting

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for predicting crop yield
  • Method and system for predicting crop yield

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050]The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0051] The object of the present invention is to provide a method and system for predicting crop yield, which can select the optimal trend yield model and improve the predictive accuracy of crop yield.

[0052] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0053] fi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and a system for determining an optimal trend yield-per-unit model. The determining method includes the following steps: acquiring historical yield-per-unit data of a crop; building a plurality of different trend yield-per-unit models according to the historical yield-per-unit data of the crop; and selecting an optimal trend yield-per-unit model by judging a plurality of indicators. Thus, the accuracy of prediction of crop yield is improved.

Description

technical field [0001] The invention relates to the field of agricultural production, in particular to a method and system for predicting crop yield. Background technique [0002] In the prior art, there are many methods for predicting crop yield, which can be roughly divided into statistical prediction methods, remote sensing prediction methods and dynamic growth model methods. The most widely used method is the statistical forecasting method. Based on the statistical forecasting method, many forecasting models have been derived. One of them is a meteorological model, which focuses on the short-term impact of meteorological fluctuations on crop yields, so that crop yields can be predicted. In order to improve the accuracy of forecasting crop yield, it is also necessary to consider the crop trend yield model. The conventional method only needs to judge the indicator once and relies too much on a certain indicator. For example, use the root mean square error of several trend ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/04G06Q50/02
CPCG06Q10/04G06Q50/02
Inventor 许世卫庄家煜陈威王禹张超
Owner AGRI INFORMATION INST OF CAS
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More